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Organic single crystals: Addressing the fundamentals of organic electronics

Published online by Cambridge University Press:  14 January 2013

Vitaly Podzorov*
Affiliation:
Department of Physics and Astronomy, Rutgers University; podzorov@physics.rutgers.edu

Abstract

Organic optoelectronics is an emerging field that exploits the unique properties of conjugated organic materials to develop new applications that require a combination of performance, low cost, light weight, and processability. For instance, disposable or wearable electronics, light-emitting diodes, smart tags, sensors, and solar cells all fall into this active area of research. Single crystals of conjugated organic molecules are, undoubtedly, the materials with the highest degree of order and purity among the variety of different forms of organic semiconductors. Electronic devices comprising these materials, such as single-crystal transistors and photoconductors developed during the last decade, are by far the best performers in terms of the fundamental parameters such as charge-carrier mobility, exciton diffusivity, concentration of defects, and operational stability. Extremely low density of defects and the resultant remarkable electrical characteristics of some of the organic single-crystal devices allow experimental access to the intrinsic charge transport properties not dominated by charge scattering and trapping. This enables basic studies of the physics of organic semiconductors, including examining the intrinsic structure-property relationship, thus providing a test bed for charge and energy transport theories. The goal of this issue of MRS Bulletin is to provide a broad overview of the state of the art of the field of organic semiconductor single-crystal materials, devices, and theory.

Information

Type
Research Article
Copyright
Copyright © Materials Research Society 2013
Figure 0

Figure 1. Organic single crystals and crystalline films of popular small-molecule compounds used in organic electronics: (a) Rubrene,4 (b) tetracene,4 (c) 5,11-bis(triethylsilylethynyl)anthradithiophene (TES-ADT) (reproduced with permission from Reference 51, © 2009 Wiley), (d) dimethyl-pentacene,55 (e) ultrathin sheet of wrinkled rubrene (reproduced with permission from Reference 38, © 2012 Wiley), and (f) 2,7-dioctyl[1]benzothieno[3,2-b][1] benzothiophene (C8-BTBT) (reproduced with permission from Reference 52, © 2009 The Japan Society of Applied Physics). The single crystals in (a), (b), (d), and (e) were grown from vapor; the rubrene sheet in (e) is laminated at the surface of the polydimethylsiloxane stamp. The crystalline films in (c) and (f) are grown from solutions at an SiO2 surface.

Figure 1

Figure 2. Different approaches to fabrication of single-crystal organic field-effect transistors (OFETs). (a) A high-mobility freestanding rubrene OFET with a conformal parylene gate dielectric, wired to a sample holder.8,9 (b) “Air-gap” or “vacuum-gap” single-crystal OFETs based on soft polydimethylsiloxane (PDMS) transistor stamps, in which an undesirable interaction of the dielectric with a clean surface of the crystal is avoided due to the separation of the recessed gate electrode from the conduction channel by a few μm-thick gap15,70 (reproduced with permission from Reference 70, © 2004 Wiley). (c) Single-crystal OFETs based on hard Si/SiO2 structures with evaporated contacts and an electrostatically attached thin single crystal10,12 (reproduced with permission from Reference 12, © 2003 American Institute of Physics). (d) Mechanically flexible single-crystal OFETs on Kapton substrates with a polymer gate dielectric (PVP) (reproduced with permission from Reference 56, © 2006 Wiley). (e) Single-crystal OFETs using a thin, freestanding plastic membrane laminated against the surface of a crystal by vacuum (gate is not shown) (reproduced with permission from Reference 71, © 2011 Wiley). Note: S, source; D, drain; G, gate; OTS, octyl trichloro-silane; PET, polyethylene terephthalate; PVP, polyvinylpyrrolidone; ITO, indium tin oxide.

Figure 2

Figure 3. Linear (top panel) and saturation (bottom panel) regime measurements of rubrene single-crystal organic field-effect transistors (OFETs) made by the vacuum lamination method.71 The devices demonstrate all the features of classical high-performance FETs. In the linear regime, the transconductance ISD(VG) measured at different source-drain voltage (VSD) values (indicated) exhibits remarkable linearity, as predicted by the FET equation (Equation 1). The extraction of linear mobility using this equation results in all the μ(VG) dependences collapsing on the same plateau (the inset). In the saturation regime, taking a square root of the ISD(VG) curve (blue) results in perfectly linear ISD1/2(VG) characteristics (red), as prescribed by the FET equation (Equation 2). The mobilities in the linear and saturation regimes are consistent. The contact resistance, hysteresis, and threshold voltage are negligible. Note: VG, gate voltage; μlin, linear mobility; μsat, saturation mobility; ISD, source-drain current.

Figure 3

Figure 4. Some of the fundamental results obtained with single-crystal organic field-effect transistors (OFETs) (the case of rubrene; a and b are the two main crystallographic axes of rubrene). (a) Observation of the intrinsic coherent charge transport in molecular crystals. Non-activated, band-like temperature dependence and anisotropy of longitudinal field-effect mobility measured along a (open symbols) and b (solid symbols) axes (reproduced with permission from Reference 15, © 2004 The American Physical Society). The crystal structure of rubrene is shown schematically. (b) Mobility anisotropy. High angular resolution measurements of anisotropy of the field-effect mobility.19,20 The measurements have been performed using rubrene crystals laminated against PDMS stamps with a high-resolution contact pattern defined by lithography. The fit is a least squares regression of the diagonal mobility tensor with diagonal components μa and μb (reproduced with permission from Reference 20, © 2007 Wiley). (c) Hall effect as evidence of band-like conduction. Temperature dependence of the Hall mobility (μHall, solid symbols) and longitudinal FET mobility (μFET, open symbols), and (d) Hall voltage signal (VH, black) recorded as a function of time (t), as the magnetic field (B, red) is swept back and forth. The black dotted line is a linear fit of the drifting offset voltage that develops on the Hall probes at B = 0 (reproduced with permission from Reference 29, © 2005 The American Physical Society). A clear change in the Hall effect sign with reversal of the magnetic field direction is observed. Hall-bar/4-probe contact geometry is schematically shown. Note: μ, charge-carrier mobility; T, temperature; μa and μb, hole mobilities measured along a and b crystallographic directions in rubrene, respectively; S, source; D, drain.