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Epitaxial graphene on silicon carbide: Introduction to structured graphene

Published online by Cambridge University Press:  23 November 2012

Ming Ruan
Affiliation:
Georgia Institute of Technology; ruan@gatech.edu
Yike Hu
Affiliation:
Georgia Institute of Technology; yhu9@mail.gatech.edu
Zelei Guo
Affiliation:
Georgia Institute of Technology; zguo34@gatech.edu
Rui Dong
Affiliation:
Georgia Institute of Technology; rui.dong@physics.gatech.edu
James Palmer
Affiliation:
Georgia Institute of Technology; jimbopalmer@gatech.edu
John Hankinson
Affiliation:
Georgia Institute of Technology; jhankinson@gatech.edu
Claire Berger
Affiliation:
Georgia Institute of Technology, USA, and CNRS/Institut Néel, France; claire.berger@physics.gatech.edu
Walt A. de Heer
Affiliation:
Georgia Institute of Technology; walter.deheer@physics.gatech.edu

Abstract

We present an introduction to the rapidly growing field of epitaxial graphene on silicon carbide, tracing its development from the original proof-of-concept experiments a decade ago to its present, highly evolved state. The potential of epitaxial graphene as a new electronic material is now being recognized. Whether the ultimate promise of graphene-based electronics will ever be realized remains an open question. Silicon electronics is based on single-crystal substrates that allow reliable patterning on the nanoscale, which is an absolute requirement for any new electronic material. That is why epitaxial graphene is based on single-crystal silicon carbide. We also present recent results on nanopatterned graphene produced by etching the silicon carbide before annealing so that the graphene structures are produced in their final shapes. This avoids postannealing patterning, which is known to greatly affect transport properties on the nanoscale. Creating such structured graphene is an elegant method for avoiding pervasive patterning problems.

Information

Type
Research Article
Copyright
Copyright © Materials Research Society 2012
Figure 0

Figure 1. Graphene growth by the confinement controlled sublimation (CCS) method. (a) A SiC chip is placed in a graphite enclosure that is provided with a small leak and inductively heated using a molybdenum sleeve as the susceptor. A quasi-equilibrium is established at high temperatures to moderate the graphene growth. (b) Photograph of the furnace showing the evacuated glass tube, the water-cooled radio-frequency induction coil, and the white-hot susceptor. (c) Schematic of graphene on SiC (silicon, yellow; carbon, black). The SiC wafer is shown as unrealistically thin to allow comparison of the two nonequivalent faces. The bottom face (C face) is covered with two graphene layers, whereas the top face (Si face) schematically terminates in a covalently bonded buffer layer. In subsequent growth on this face, the buffer layer is converted into a graphene layer by the new buffer layer that grows under it. Adapted from Reference 17.

Figure 1

Figure 2. The quantum Hall effect in C-face epitaxial monolayer graphene for micrometer-wide Hall samples with CCS-produced graphene. Resistivity ρxx (black) and Hall resistance ρxy (red) versus magnetic field at 4 K for (a) the C-face Hall bar shown in the inset (mobility μ = 39,800 cm2 V–1 s–1, charge density n = 0.19 × 1012 cm–2) and (b) the C-face Hall bar shown in the inset (μ = 21,100 cm2 V–1 s–1, n = 0.92 × 1012 cm–2), also showing the persistence of the ν = 2 plateau in ρxy at 200 K (where ν represents the filling factor). (c) Resistivity ρxx and Hall conductivity σxy = ρxy/(ρxx2 + ρxy2) versus gate voltage VG for a top-gated C-face Hall bar (1 μm × 4.3 μm), showing plateaus in the n- and p-doped regimes. The mobility for n doping is 6200 cm V–1 s–1, and that for p doping is 8500 cm V–1 s–1. The application of the top gate significantly reduces the mobility compared with those of the bare samples in (a) and (b). (d) Resistivity ρxx as a function of gate voltage at 4 K and zero magnetic field. The inset shows the Hall bar measured in (c) and (d). All scale bars are 2 μm. Adapted from References 10, 53, and 54.

Figure 2

Figure 3. Ultrahigh-frequency C-face epitaxial graphene field-effect transistor (GFET). (a) Source–drain current density (ISD) versus voltage (VSD) on a 200-nm-long gate, 3-μm-wide device at gate voltages (VG) from 0 V to 3 V in 0.5-V steps. A current density greater than 1.5 mA/μm can be applied to the device, and mild current saturation is observed at large drain–source biases. (b) ac current gain (H21) versus frequency for the GFET in (a) after de-embedding. A cutoff frequency (fT) of 90 GHz is extracted by extrapolating the measurement to unity gain. Inset: Atomic force microscopy (AFM) image of a dual-gate GFET similar to the one measured in (a) and (b). D, drain; G, gate; S, source. Scale bar = 5 μm. Adapted from Reference 10.

Figure 3

Figure 4. Capping method for structured graphene growth using a patterned AlN cap. (a) AFM image of a completed graphene Hall bar structure fabricated by the CCS method. The light gray areas correspond to graphene, and the dark areas correspond to AlN-covered regions that prevent graphene growth. Metal contacts (gold/palladium) are applied for subsequent electrical measurements. This Hall bar has a Hall mobility of about 600 cm2 V–1 s–1, significantly less than that of pristine graphene. (b) Micro-Raman spectrum of the AlN-capped SiC substrate, which does not exhibit graphene features after CCS annealing. (c) Micro-Raman spectrum of the graphene areas, showing characteristic graphene features (D, G, and 2D bands). The relatively intense D band confirms that the graphene is significantly disordered, accounting for the observed low mobilities. Adapted from Reference 64.

Figure 4

Figure 5. Illustrative example of structured growth patterning. (a)–(c) Schematic illustration of the production of structured graphene and devices: (a) A vertical step is etched in the SiC substrate. (b) After CCS growth, the sidewall has recrystallized into a stable SiC facet, on which graphene grows preferentially. (c) Repeated plasma etching produces structures with varying depths. (d–f) A graphene ribbon is seamlessly connected to wide graphene leads. (d) AFM image of a SiC surface patterned with two deep U-shaped etched trenches (dark lines) connected to a shallow trench for subsequent graphene nanoribbon growth. Four wide graphene leads form at the edges of the two deep trenches. These form electrical leads connected to two thin graphene ribbons that form on the upper and lower edges of the shallower trench (faint horizontal stripe). (e) AFM image, representing the topography, and (f) electrostatic force microscopy (EFM) image, whose contrast distinguishes graphene from silicon carbide, of the surface presented in (d) after CCS graphitization. The rounding comes from the SiC step flow to produce a stable crystalline SiC facet. Adapted from References 10 and 12.

Figure 5

Figure 6. Examples of epitaxial graphene sidewall structures produced by the structured growth method, demonstrating its versatility: (a) an array of parallel ribbons grown on the step edges of a vicinal surface, (b) graphene grown in many orientations on the sidewalls of complex convoluted trenches, (c) a Hall bar with four transverse voltage probes, and (d) rings grown on the sidewalls of pillars. The top images in (a), (b), and (d) and the left image in (c) represent the AFM topography, and the corresponding bottom and right images are EFM images showing bright areas where graphene grows at the edges of the etched patterns. Adapted from Reference 10.

Figure 6

Figure 7. (a) AFM image, (b) Raman 2D peak mapping, and (c) EFM image of a Si-face SiC surface with graphene selectively grown on the sidewalls, confirming that graphene growth is largely confined to the sidewalls.

Figure 7

Figure 8. Example of large-scale patterning of epitaxial graphene devices using the structured growth method. (a) Illustration of 10,000 transistors fabricated within a 4 mm × 6 mm chip using the sidewall graphitization method, with a schematic of the transistor structure at the top right. (b) Typical gating characteristics between source S and drain D showing the conductance G (in millisiemen-squares) versus gate voltage VG. Inset: Plan view of the transistor structure. Scale bar, 20 μm; channel length, 7 μm. Adapted from Reference 12.