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Excitation spectrum of point defects in semiconductors studied by time-dependent density functional theory

Published online by Cambridge University Press:  24 January 2012

Adam Gali*
Affiliation:
Institute for Solid State Physics and Optics, Wigner Research Center for Physics, Hungarian Academy of Sciences, Budapest, H-1525; and Department of Atomic Physics, Budapest University of Technology and Economics, Budapest, H-1111, Hungary
*
a)Address all correspondence to this author. e-mail: agali@eik.bme.hu

Abstract

A common fingerprint of the electrically active point defects in semiconductors is the transition among their localized defect states upon excitation, which may result in characteristic absorption- or photoluminescence spectrum. Identification of such point defects by means of density functional theory (DFT) calculations with traditional (semi) local functionals suffers from two problems: the “band gap error” and the many-body nature of the electron-hole interaction of the excited state. We show that non local hybrid density functionals may effectively mimic the quasiparticle correction of the band edges and the defect levels within the band gap in group-IV semiconductors, thus they can effectively heal the “band gap error.” The electron-hole interaction can be calculated by time-dependent DFT (TD-DFT) method. Here, we apply TD-DFT on three topical examples: nitrogen-vacancy defect in diamond, silicon-vacancy and divacancy defects in silicon carbide that are candidates in effective development of solid-state quantum bits.

Information

Type
Invited Feature Paper
Copyright
Copyright © Materials Research Society 2012
Figure 0

FIG. 1.The energy (E) versus configuration coordinate (q) diagram for the excitation process of a defect in the Franck-Condon approximation: Eg, Ee are the minima in the quasi-parabolic potential energy surfaces of the defect in the ground and excited states, respectively and qg, qe the corresponding coordinates. ZPE is the zero point energy (indicated only for the ground state). The energy ladders show the phonon energies with the phonon ground states at n = 0 (ground state of the defect) and m = 0 (excited state). At elevated temperatures, the high-energy phonon states can be occupied by inducing transition A → B (vertical absorption, green arrow), and C → D (vertical emission, red arrow). Transition A ↔ C corresponds to the ZPL (blue double arrow) both in absorption and emission. The energy of the Stokes shift is the energy difference between vertical absorption and emission which is equal to the sum of the energies represented by S and AS that are the relaxation energies of nuclei upon photon absorption and emission, respectively.

Figure 1

TABLE I.Comparison of PBE and HSE06 results38 for the lattice constant a, fundamental (indirect) gap (Eg), first allowed direct transition at the Brillouin-zone center (${\rm{\Gamma }}_{{\rm{25}}} \,, \to {\rm{\Gamma }}_2 , = E_g^d $) with experimental data90,91 in case of the Group-IV semiconductors

Figure 2

FIG. 2.(a) The structure of N − V− center in diamond; only first- and second-neighbor C (cyan spheres) and N (blue sphere) atoms to the vacant site are shown. The yellow and red lobes are contours of the calculated spin density. (b) Schematic diagram of the defect states in the gap and their occupation in the 3A2 (ground) and 3E (excited) states.

Figure 3

FIG. 3.The calculated Kohn-Sham levels with respect to the VBM in the ground state of the NV defect. The results obtained in a 512-atom supercell by LDA functional in Ref. 53.

Figure 4

TABLE II.Comparison of the scissors- and the G0W0 quasiparticle corrections to the Kohn-Sham levels obtained by LDA functional for interstitial H in Si and 3C-SiC

Figure 5

FIG. 4.(a) The optimized geometry of silicon vacancy in the ground state. Cyan and yellow balls represent C and Si atoms, respectively. (b) Schematic diagram about the defect states in bulk 4H-SiC in the 4A2 ground and 4A2, 4A excited states. VB and CB represent valence bands and conduction bands, respectively. The arrows show the luminescence processes with the corresponding polarization of the emitted light.

Figure 6

TABLE III.The relative positions of defect levels of NV center in the ground state in eV where α and β label the spin-up and spin-down channels, respectively.

Figure 7

FIG. 5.(a) The optimized geometry of the divacancy in the ground state. Cyan and yellow balls represent C and Si atoms, respectively. The open circles depict the vacant sites. (b) Schematic diagram about the defect states in bulk 3C-SiC in the 3A2 ground and 3E excited states. The upper e-level appears in the gap of bulk hexagonal SiC polytypes or nano 3C-SiC.