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Microcompression study of Al-Nb nanoscale multilayers

Published online by Cambridge University Press:  20 January 2012

Youbin Kim
Affiliation:
Graduate School of EEWS, Korea Advanced Institute of Science and Technology, Yuseong Gu, Daejeon 305-701, Republic Korea
Arief Suriadi Budiman
Affiliation:
Center for Integrated Nanotechnologies (CINT), Los Alamos National Laboratory (LANL), Los Alamos, New Mexico 87545
J. Kevin Baldwin
Affiliation:
Center for Integrated Nanotechnologies (CINT), Los Alamos National Laboratory (LANL), Los Alamos, New Mexico 87545
Nathan A. Mara
Affiliation:
Center for Integrated Nanotechnologies (CINT), Los Alamos National Laboratory (LANL), Los Alamos, New Mexico 87545
Amit Misra
Affiliation:
Center for Integrated Nanotechnologies (CINT), Los Alamos National Laboratory (LANL), Los Alamos, New Mexico 87545
Seung Min Han*
Affiliation:
Graduate School of EEWS, Korea Advanced Institute of Science and Technology, Yuseong Gu, Daejeon 35-701, Republic Korea
*
a)Address all correspondence to this author. e-mail: smhan01@kaist.ac.kr

Abstract

Microcompression tests were performed on the Al/Nb multilayers of incoherent interfaces with the layer thicknesses of 5 nm Al/5 nm Nb and 50 nm Al/50 nm Nb. The Al-Nb multilayers showed increase in strength as the layer thickness was reduced; the average flow stresses at 5% plastic strain from the 5 nm Al/5 nm Nb and 50 nm Al/50 nm Nb layer thickness specimens were determined to be 2.1 GPa and 1.4 GPa respectively. The results from this Al-Nb microcompression study were compared with those of the previous report on Cu-Nb multilayer microcompression results that indicated that the flow stresses of the Al-Nb multilayer are lower than those of Cu-Nb with the same bilayer spacing. The observed difference in strength was attributed to a potential difference in the interfacial strength of the two incoherent multilayer systems.

Information

Type
Articles
Copyright
Copyright © Materials Research Society 2012
Figure 0

FIG. 1. Bright-field TEM (BF TEM) for the Al-Nb multilayers with 50 nm Al/50 nm Nb layer spacing. The selected area diffraction in the inset confirms the {111} Al//{110} Nb Kurdjumov-Sachs orientation relationship.

Figure 1

FIG. 2. SEM micrographs of pillars. (a) 50 nm Al/50 nm Nb layer thickness and (b) 5 nm Al/5 nm Nb layer thickness micropillar before compression. (c) 50 nm Al/50 nm Nb layer thickness and (d) 5 nm Al/5 nm Nb layer thickness micropillar after compression.

Figure 2

FIG. 3. The stress versus strain plot for the micropillars synthesized from the Al-Nb multilayers with 5 nm Al/5 nm Nb and 50 nm Al/50 nm Nb layer thicknesses.

Figure 3

FIG. 4. The 5% flow stress versus bilayer thickness plot showing that the Al-Nb specimen strength is increased with decreased bilayer spacing.

Figure 4

FIG. 5. The stress versus strain plot of Al-Nb pillars with 5 nm Al/5 nm Nb and 50 nm Al/50 nm Nb thickness and Cu-Nb with 5 nm Cu/5 nm Nb and 40 nm Cu/40 nm Nb layer thickness.

Figure 5

FIG. 6. (a) HRTEM image of Al-Nb interface showing that the thickness of the intermixing is 2.0 nm. (b) Scanning transmission electron microscopy image of Al-Nb layers and the EDS line profile across the interface showing that the average distance of intermixing is 3.5 nm for the 50 nm Al/50 nm Nb specimen.

Figure 6

FIG. 7. (a) Cross-sectional BF TEM image of deformed pillar at low magnification, higher magnification view of the regions of macroshear that are highlighted in (b) red box and (c) blue box for the 50 nm Al/50 nm Nb specimen.