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A superheterodyne 300 GHz receiver and transmitter chip set with high bandwidth and efficiency performance

Published online by Cambridge University Press:  24 September 2026

Lukas Julian Gebert*
Affiliation:
Institute of Robust Power Semiconductor Systems, University of Stuttgart, Germany
Benjamin Schoch
Affiliation:
Institute of Robust Power Semiconductor Systems, University of Stuttgart, Germany
Thomas Ufschlag
Affiliation:
Institute of Robust Power Semiconductor Systems, University of Stuttgart, Germany
Dominik Wrana
Affiliation:
Institute of Robust Power Semiconductor Systems, University of Stuttgart, Germany
Simon Haussmann
Affiliation:
Institute of Robust Power Semiconductor Systems, University of Stuttgart, Germany
Sebastien Chartier
Affiliation:
Fraunhofer Institute for Applied Solid State Physics IAF, Freiburg, Germany
Sandrine Wagner
Affiliation:
Fraunhofer Institute for Applied Solid State Physics IAF, Freiburg, Germany
Ingmar Kallfass
Affiliation:
Institute of Robust Power Semiconductor Systems, University of Stuttgart, Germany
*
Corresponding author: Lukas Julian Gebert; Email: lukas.gebert@ilh.uni-stuttgart.de
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Abstract

This paper presents a superheterodyne receiver and transmitter chip set with high bandwidth and efficiency suitable for superheterodyne communication systems. The operating range for the intermediate frequency is optimized for 60–90 GHz but extends beyond this frequency range. A radio frequency range from 285 and 325 GHz is achieved with the chip set introduced here. This paper presents continuous-wave on-wafer measurements for the receiver and transmitter. In the measurements, the transmitter achieves an output-referred 1 dB compression point of 0 dBm across the entire IF range. The conversion gain of the transmitter is measured to be 15 dB but can be adjusted between 5 and 20 dB. The CG of the receiver was measured to be over 12 dB within an IF range of 60–90 GHz. A receiver noise figure of 8 dB was measured in a waveguide package. The front-ends were produced in 35nm indium gallium arsenide metamorphic high electron mobility transistor technology.

Information

Type
Research Paper
Creative Commons
Creative Common License - CCCreative Common License - BY
This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (http://creativecommons.org/licenses/by/4.0), which permits unrestricted re-use, distribution and reproduction, provided the original article is properly cited.
Copyright
© The Author(s), 2026. Published by Cambridge University Press in association with The European Microwave Association.
Figure 0

Figure 1. 35 nm InGaAs mHEMT technology BEOL layer stack.

Figure 1

Figure 2. A basic block diagram of the Tx (a) and Rx (b) presented here.

Figure 2

Figure 3. A chip micrograph of the Tx (a) and RX (b) presented here, each with a chip size of 2.75$\times$×1 $\rm{mm^{2}}$mm2.

Figure 3

Figure 4. Schematic of the standalone X2 with optimized output matching using harmonic load-pull simulations.

Figure 4

Figure 5. Simulation results of the standalone X2 with optimized output matching using harmonic load-pull simulation, with an input power of 4 dBm.

Figure 5

Figure 6. Schematic of the resistive mixer including the LO, IF, and RF matching networks.

Figure 6

Figure 7. Block diagram of the LNA (left) and the HPA (right) used as a multi-purpose amplifier in the Rx and Tx.

Figure 7

Figure 8. Simulated (dashed) and measured (solid) Tx CG plotted versus RF frequency for different LO frequencies with ${P_{\mathrm{LO}}}$PLO = 4 dBm and ${P_{\mathrm{RF}}}$PRF = $-$−35 dBm (a) and the CG plotted versus IF frequency for different RF powers with ${P_{\mathrm{LO}}}$PLO = 4 dBm and ${f_{\mathrm{LO}}}$fLO = 110 GHz (b).

Figure 8

Figure 9. Simulated (dashed) and measured (solid) Tx CG plotted versus IF power for different current densities in the LNA stage with ${P_{\mathrm{LO}}}$PLO = 4 dBm, ${f_{\mathrm{IF}}}$fIF = 80 GHz and ${f_{\mathrm{LO}}}$fLO = 110 GHz (a) and the achieved CG at compression and OP1dB plotted versus the current density in the LNA stage with ${P_{\mathrm{LO}}}$PLO = 4 dBm, ${f_{\mathrm{IF}}}$fIF = 80 GHz and ${f_{\mathrm{LO}}}$fLO = 110 GHz (b).

Figure 9

Figure 10. Simulated (dashed) and measured (solid) Rx CG plotted versus RF frequency for different LO frequencies with ${P_{\mathrm{LO}}}$PLO = 4 dBm and ${P_{\mathrm{RF}}}$PRF = $-$−35 dBm (a) and the CG plotted versus IF frequency for different RF powers with ${P_{\mathrm{LO}}}$PLO = 4 dBm and ${f_{\mathrm{LO}}}$fLO = 110 GHz (b).

Figure 10

Figure 11. Simulated (dashed) and measured (solid) Tx RF output power plotted versus LO power for different LO frequencies, an IF frequency of 80 GHz and an IF power of $P_{\mathrm{IF}}$PIF = $-$−10 dBm (a) and the Rx CG plotted versus the gate voltage of the resistive mixer for different LO frequencies with an LO power of ${P_{\mathrm{LO}}}$PLO = $-$−5 dBm, an RF power of $P_{\mathrm{RF}}$PRF = $-$−35 dBm and an If frequency of $f_{\mathrm{IF}}$fIF = 80 GHz (b).

Figure 11

Table 1. Comparison of published state-of-the-art THz front-ends