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Combined XRD-XRF cluster analysis for automatic chemical and crystallographic surface mappings

Published online by Cambridge University Press:  03 May 2019

M. Bortolotti*
Affiliation:
Department of Industrial Engineering, University of Trento, IT, Italy
L. Lutterotti
Affiliation:
Department of Industrial Engineering, University of Trento, IT, Italy
E. Borovin
Affiliation:
Department of Industrial Engineering, University of Trento, IT, Italy
D. Martorelli
Affiliation:
Department of Industrial Engineering, University of Trento, IT, Italy
*
a)Author to whom correspondence should be addressed. Electronic mail: mauro.bortolotti@unitn.it

Abstract

X-ray diffraction-X-ray fluorescence (XRD-XRF) data sets obtained from surface scans of synthetic samples have been analysed by means of different data clustering algorithms, with the aim to propose a methodology for automatic crystallographic and chemical classification of surfaces. Three data clustering strategies have been evaluated, namely hierarchical, k-means, and density-based clustering; all of them have been applied to the distance matrix calculated from the single XRD and XRF data sets as well as the combined distance matrix. Classification performance is reported for each strategy both in numerical form as the corrected Rand index and as a visual reconstruction of the surface maps. Hierarchical and k-means clustering offered comparable results, depending on both sample complexity and data quality. When applied to XRF data collected on a two-phases test sample, both algorithms allowed to obtain Rand index values above 0.8, whereas XRD data collected on the same sample gave values around 0.5; application to the combined distance matrix improved the correlation to about 0.9. In the case of a more complex multi-phase sample, it has also been found that classification performance strongly depends on both data quality and signal contrast between different regions; again, the adoption of the combined dissimilarity matrix offered improved classification performance.

Information

Type
Technical Articles
Copyright
Copyright © International Centre for Diffraction Data 2019 
Figure 0

Figure 1. The combined XRD/XRF instrument for automated 2D data collection. (a) Microfocus Mo source (b) CPS120 XRD Curved Position Detector (c) Si Pin XRF detector (d) XYZ motorized sample stage.

Figure 1

Figure 2. Synthetic samples providing a test suite for evaluating the performance of the different data clustering strategies. (a) Steel alloy cube embedded in resin; (b) metallic rods embedded in amorphous resin.

Figure 2

Figure 3. (a) Dendrogram plot obtained from the hierarchical clustering classification on the XRD data set; (b) cluster plot on the same data after the dendrogram cut corresponding to three clusters.

Figure 3

Figure 4. Sample 1 area reconstruction based on the Hierarchical Clustering classification performed on the distance matrix calculated on the XRD data set (b), XRF data set (c) and combined data set (d). (a) represents the reference classification obtained from the color discretization of the optical image of the area under consideration.

Figure 4

TABLE I. Corrected Rand index values obtained from the comparison between the data clustering runs performed on sample 1 and sample 2 and their relative reference classifications.

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Figure 5. Sample 2 area reconstruction based on the Hierarchical Clustering classification performed on the distance matrix calculated on the XRD data set (b), XRF data set (c) and combined data set (d). (a) represents the reference classification obtained from the color discretization of the optical image of the area under consideration.

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