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Plasticity-induced oxidation reactivity on Ni(100) studied by scanning tunneling spectroscopy

Published online by Cambridge University Press:  14 October 2011

F.W. Herbert
Affiliation:
Department of Materials Science & Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139
K.J. Van Vliet*
Affiliation:
Department of Materials Science & Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139
B. Yildiz*
Affiliation:
Department of Nuclear Science & Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139
*
Address all correspondence to K.J. Van Vliet atkrystyn@mit.edu and B. Yildiz atbyildiz@mit.edu
Address all correspondence to K.J. Van Vliet atkrystyn@mit.edu and B. Yildiz atbyildiz@mit.edu

Abstract

Using in situ indentation, we show that highly localized and well-defined mechanical deformation can be coupled with structural and electronic characterization in the scanning tunneling microscope. Dislocations induced in Ni(100) were topographically imaged and probed by scanning tunneling spectroscopy to assess their effect on local surface electronic structure. Compared with undamaged terraces, dislocation regions exhibited a significant increase in local density of states near the Fermi level, and enhanced reactivity toward oxidation. In the context of the d-band electronic structure model, we suggest that the undercoordination of atoms and residual strain resulting from plastic deformation serve to locally accelerate adsorption-driven chemical reactions with species such as molecular oxygen.

Information

Type
Rapid Communications
Copyright
Copyright © Materials Research Society 2011
Figure 0

Figure 1. In situ topographical characterization of induced plastic deformation formed by indentation with the STM tip. (a) Indentation of single-crystal Ni(100): A denotes the indented region, B the undeformed, atomically flat terrace, and C a surface step formed by the coherent nucleation and propagation of dislocations; (b) line trace taken along the arrow shown in (a) indicates a step height of 0.15–0.2 nm. Imaging conditions: sample bias of −0.3 V, feedback tunneling current 1 nA.

Figure 1

Figure 2. (a) In situ electronic structure characterization of the Ni(100) surface upon STM tip-induced plasticity. Differential tunneling conductance measurements, dI/dV, obtained both at dislocation steps (solid curve) and away from dislocations (dashed curve). Each curve is the average of over 100 point spectra from three different indentations. The error in dI/dV measured by standard deviation is ±18%, represented by dashed enveloping curves. Schematic density of state diagrams illustrate how an increase in DOS around EF can be interpreted as an up-shift in the Ni d-band center from (b) ɛdflat at the undamaged surface to (c) ɛddisl at dislocations (after [14]).

Figure 2

Figure 3. STM images of dislocation steps (perpendicular linear features) created by STM tip indentation: (a) immediately following indentation under UHV and (b) after exposure to 100 L O2. (c) Line traces along the white arrow direction corresponding to images (a) and (b). (d) STM image of the atomically flat surface and pre-existing terrace step under UHV with the corresponding image (e) taken after 100 L exposure for comparison. (f) Line traces corresponding to the arrow direction in (d) and (e). Imaging conditions: −0.15 V, 1 nA. Scale bar: 20 nm.

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