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Combinatorial thin film screening to identify single-phase, non-equiatomic high entropy alloys in the MnFeCoNiCu system

Published online by Cambridge University Press:  25 April 2019

Azin Akbari
Affiliation:
Department of Chemical and Materials Engineering, University of Kentucky, 177 F. Paul Anderson Tower, Lexington KY 40506, USA
Thomas J. Balk*
Affiliation:
Department of Chemical and Materials Engineering, University of Kentucky, 177 F. Paul Anderson Tower, Lexington KY 40506, USA
*
Address all correspondence to Thomas J. Balk at john.balk@uky.edu

Abstract

To identify new face centered cubic high entropy alloys (HEAs), MnFeCoNiCu thin film samples were prepared by simultaneous magnetron sputtering of elements onto Si wafers. This sputtering arrangement yielded compositional gradients in the samples. The films exhibited regions with different phases, some of which were single-phase and non-equiatomic. To screen the crystal structure and composition across film samples, multiple characterization techniques were used: scanning electron microscopy, focused ion beam, energy-dispersive x-ray spectroscopy, x-ray diffraction, and electron backscattered diffraction analysis. Using this combinatorial method, candidate single-phase HEAs were identified and then successfully arc-melted in bulk form, followed by thermomechanical processing.

Information

Type
Research Letters
Copyright
Copyright © Materials Research Society 2019 
Figure 0

Figure 1. Sputtering arrangement for thin film deposition, with the confocal target arrangement shown at the bottom. By holding the substrate (at the top) stationary during deposition, a compositional gradient film is generated, due to decreasing amounts of elemental deposition with increasing distance (measured from the target) along the substrate.

Figure 1

Figure 2. XRD scans over the range 10–100° 2θ, collected from nine distinct regions of a gradient film. EDS measurement of composition (in at.%) for each region is listed in the top right corner of the corresponding spectrum. The color schematic indicates approximate relative location of the regions analyzed.

Figure 2

Figure 3. STEM micrograph of the single-phase film location (region 4), obtained from a FIB-fabrication lamella. The columnar grain structure of the single-phase area is clearly observed here.

Figure 3

Figure 4. (a) SEM image of as-cast bulk HEA sample, exhibiting a dendritic microstructure. (b) EDS maps of a separate area from the same as-cast bulk sample, showing the segregation of elements that occurred during solidification.

Figure 4

Figure 5. SEM image of the bulk HEA sample after thermo-mechanical processing, with equiaxed grain structure.

Figure 5

Figure 6. EBSD results of the processed HEA showing (a) phase map and (b) grain orientation and confirming that a single-phase equiaxed grain structure was achieved by thermo-mechanical processing.