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Ku/Ka band diplexer based on thin-film technology for small ground-segment user terminals

Published online by Cambridge University Press:  11 June 2021

Stefano Moscato*
Affiliation:
SIAE Microelettronica S.p.A., R&D Microwave Laboratory, 20093 Cologno Monzese (MI), Italy
Giandomenico Cannone
Affiliation:
SIAE Microelettronica S.p.A., R&D Microwave Laboratory, 20093 Cologno Monzese (MI), Italy
Matteo Oldoni
Affiliation:
SIAE Microelettronica S.p.A., R&D Microwave Laboratory, 20093 Cologno Monzese (MI), Italy
Davide Tiradossi
Affiliation:
RF Microtech, 06132 Perugia (PG), Italy
Luca Pelliccia
Affiliation:
RF Microtech, 06132 Perugia (PG), Italy
Petar Jankovic
Affiliation:
European Space Agency, NL-2200, AG Noordwijk, The Netherlands
Fabrizio De Paolis
Affiliation:
European Space Agency, European Centre for Space Applications and Telecommunications (ESA/ECSAT), Didcot OX11 0FD, U.K
*
Author for correspondence: Stefano Moscato, E-mail: stefano.moscato@siaemic.com
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Abstract

This paper describes the outcome of the “Small user TErminal multi band DIplexer” project where the goal is the validation of novel SMD-compliant planar diplexer. The real application scenario concerns an integrated multi-band radio terminal for ground-segment satellite links. The advantageous and novel approach involves the simultaneous use of three different well-established concepts: a microstrip low-pass filter, a substrate integrated waveguide high-pass filter, and the thin-film technology as manufacturing process. The proposed topology applied to a planar alumina-based design guarantees a 15 × 11.1 mm2 footprint and the best integration with surface mountable soldering process over standard PCB technology. Achieved performance and resilience to environmental toughness are suitable for consumer-oriented satellite links or man-pack applications. The designed component targets the Ku 10.7–12.75 (RX) and Ka 27.5–30 (TX) GHz bands but the layout can be easily tuned across the spectrum. The described solution has been manufactured and validated. Thermal cycling and mechanical tests have been carried out to prove the high technology readiness level of the proposed device.

Information

Type
Research Paper
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press in association with the European Microwave Association
Figure 0

Fig. 1. 2D layout of the DPLX. Orange shapes show the top metal layer of the layout, blue circles the metallized vias, the green area is the package footprint.

Figure 1

Fig. 2. Layout of the PCB-to-alumina transition. Dimensions are in μm: D1 = 250, D2 = 300, L1 = 430, W1 = 880, W2 = 400. The figure also shows the PCB and alumina stack up.

Figure 2

Fig. 3. Simulated frequency behavior of the developed DPLX. Carrier PCB, package, and connectors shape have been considered. Red highlighted frequency span shows the RX channel while the green rectangle shows to the TX one.

Figure 3

Table 1. Simulation versus measurement comparison.

Figure 4

Fig. 4. Final assembly of the DPLX under measurement and die top view.

Figure 5

Fig. 5. Characterization of the back-to-back microstrip soldered on the test PCB. Red highlighted frequency span shows the RX channel while the green rectangle shows to the TX one.

Figure 6

Fig. 6. Measured S-parameters of the realized DPLX. Absorber has been placed on the top of the package to lower cross-talk between ports. Red highlighted frequency span shows the RX channel while the green rectangle shows to the TX one.

Figure 7

Fig. 7. Detail of transmission parameters and superposition of acquisitions during thermal test. Top graph shows the RX channel; bottom graph shows the TX channel.