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Beam speed effects on Ti–6Al–4V microstructures in electron beam additive manufacturing

Published online by Cambridge University Press:  13 August 2014

Xibing Gong
Affiliation:
Department of Mechanical Engineering, The University of Alabama, Tuscaloosa, Alabama 35487, USA
James Lydon
Affiliation:
Advanced Manufacturing Technology Team, Marshall Space Flight Center, Huntsville, Alabama 35812, USA
Kenneth Cooper
Affiliation:
Advanced Manufacturing Technology Team, Marshall Space Flight Center, Huntsville, Alabama 35812, USA
Kevin Chou*
Affiliation:
Department of Mechanical Engineering, The University of Alabama, Tuscaloosa, Alabama 35487, USA
*
a) Address all correspondence to this author. e-mail: kchou@eng.ua.edu

Abstract

The effect of the beam scanning speed on part microstructures in the powder-bed electron beam additive manufacturing (EBAM) process was investigated in this research. Four levels of the beam speed were tested in building EBAM Ti–6Al–4V samples. The samples were subsequently used to prepare metallographic specimens for observations by optical microscopy and scanning electron microscopy. During the experiment, a near-infrared thermal imager was also used to acquire build surface temperatures for melt tool size estimates. It was found that the X-plane (side surface) shows columnar prior β grains, with the width in the range of about 40–110 µm, and martensitic structures. The width of columnar grains decreases with the increase of the scanning speed. In addition, the Z-plane (scanning surface) shows equiaxed grains, in the range of 50–85 µm. The grain size from the lowest beam speed (214 mm/s) is much larger compared to other samples of higher beam speeds (e.g., 376–689 mm/s). In addition, increasing the beam scanning speed will also result in finer α-lath. However, the porosity defect on the build surface also becomes severe at the highest scanning speed (689 mm/s).

Information

Type
Articles
Copyright
Copyright © Materials Research Society 2014 
Figure 0

TABLE I. Chemical analysis for Ti–6Al–4V powder in wt.%.2

Figure 1

FIG. 1. EBAM parts built with different SFs.

Figure 2

FIG. 2. Microstructure of X-plane (side surface) specimen from an EBAM sample (SF 36): (a) low magnification showing columnar width analysis, and (b) high magnification image.

Figure 3

FIG. 3. Microstructure of Z-plane (scanning surface) specimen from an EBAM sample (SF 36): (a) low magnification showing grain size analysis, and (b) high magnification image.

Figure 4

FIG. 4. Scanning electron micrographs from Z-plane of an EBAM sample: (a) 1000 × image, and (b) 5000 × image showing α-lath analysis.

Figure 5

FIG. 5. Average temperature profiles from different beam speeds at build height of 24.43 mm.

Figure 6

FIG. 6. Melt pool size versus beam scanning speed at build height of 24.43 mm.

Figure 7

FIG. 7. OM microstructures from X-plane specimens: (a) SF 20, (b) SF 50, and (c) SF 65.

Figure 8

TABLE II. Measured characteristic sizes from samples with various SFs.

Figure 9

FIG. 8. OM microstructures from Z-plane specimens: (a) SF 20, (b) SF 50, and (c) SF 65.

Figure 10

FIG. 9. SEM micrograph from Z-plane specimens: (a, b) SF 20 and (c, d) SF 50.