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Conjugated liquid layers driven by the short-wavelength Bénard–Marangoni instability: experiment and numerical simulation

Published online by Cambridge University Press:  13 October 2015

Iman Nejati
Affiliation:
Institute for Nano- and Microfluidics, Center of Smart Interfaces, TU Darmstadt, Alarich-Weiss-Strasse 10, 64287 Darmstadt, Germany
Mathias Dietzel*
Affiliation:
Institute for Nano- and Microfluidics, Center of Smart Interfaces, TU Darmstadt, Alarich-Weiss-Strasse 10, 64287 Darmstadt, Germany
Steffen Hardt
Affiliation:
Institute for Nano- and Microfluidics, Center of Smart Interfaces, TU Darmstadt, Alarich-Weiss-Strasse 10, 64287 Darmstadt, Germany
*
†Email address for correspondence: dietzel@csi.tu-darmstadt.de

Abstract

The coupled dynamics of two conjugated liquid layers of disparate thicknesses, which coat a solid substrate and are subjected to a transverse temperature gradient, is investigated. The upper liquid layer evolves under the short-wavelength Bénard–Marangoni instability, whereas the lower, much thinner film undergoes a shear-driven long-wavelength deformation. Although the lubricating film should reduce the viscous stresses acting on the up to one hundred times thicker upper layer by only 10 %, it is found that the critical Marangoni number of marginal stability may be as low as if a stress-free boundary condition were applied at the bottom of the upper layer, i.e. much lower than the classical value of 79.6 known for a single film. Furthermore, it is experimentally verified that the deformation of the liquid–liquid interface, albeit small, has a non-negligible effect on the temperature distribution along the liquid–gas interface of the upper layer. This stabilizes the hexagonal pattern symmetry towards external disturbances and indicates a two-way coupling of the different layers. The experiments also demonstrate how convection patterns formed in a liquid film can be used to pattern a second conjugated film. The experimental findings are verified by a numerical model of the coupled layers.

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© 2015 Cambridge University Press 
Figure 0

Figure 1. (a) Cross-section of the experimental set-up (drawn to scale). (b) Those parts of the experimental set-up located inside the rectangle indicated by a dashed line in (a) (magnified view). A thin silicon wafer placed on top of the copper plate is used as a light-reflecting surface. The Plexiglas ring is placed onto the silicon wafer, whose inner area is smaller than the area of the Peltier device. This ensures a homogeneous temperature distribution beneath the liquid films. The contact area between the Plexiglas ring and the silicon wafer has been sealed.

Figure 1

Table 1. Physical properties of FC-70 and silicone oil (as obtained from the manufacturers).

Figure 2

Figure 2. Sketch of the employed shadowgraphy system.

Figure 3

Figure 3. (a) Schematic of the coupled configuration of two conjugated liquid layers (side view). The streamlines in the upper liquid film are sketched as solid lines, while the edges of the convection cells are illustrated as dotted lines. (b) Snapshot of a typical experimental result (top view). The bright lines are edges of the convection cells emerging in the upper layer, whereas the bright spots at the cell centres are bulges of the lower liquid film. Here, $h_{02}=960~{\rm\mu}\text{m}$, and the temperature difference across the upper layer is ${\rm\Delta}T_{2}=4.4~\text{K}$ (corresponding to $Ma=390$).

Figure 4

Figure 4. Wavelength of the pattern in the lower film changing with variation of the upper film thickness. The thickness of the upper film and the characteristic temperature difference across it are (a) $h_{02}=510~{\rm\mu}\text{m}$, ${\rm\Delta}T_{2}=2.5\,^{\circ }\text{C}$ ($Ma=112$, ${\it\lambda}\approx 1.6~\text{mm}$), (b) $h_{02}=610~{\rm\mu}\text{m}$, ${\rm\Delta}T_{2}=3~\text{K}$ ($Ma=163$, ${\it\lambda}\approx 1.8~\text{mm}$) and (c) $h_{02}=970~{\rm\mu}\text{m}$, ${\rm\Delta}T_{2}=4~\text{K}$ ($Ma=341$, ${\it\lambda}\approx 2.9~\text{mm}$). In all cases, the thickness of the lower film is $5~{\rm\mu}\text{m}$.

Figure 5

Figure 5. The dimensionless wavenumber $q=2{\rm\pi}h_{02}/{\it\lambda}$ as  a function of ${\it\epsilon}={\rm\Delta}T_{2}/{\rm\Delta}T_{2C}-1$ after the onset of instability in the upper liquid layer. Here ${\it\lambda}$ denotes the wavelength of the pattern. The initial thickness of the upper layer is $640~{\rm\mu}\text{m}$. Open squares correspond to data obtained by increasing ${\it\epsilon}$, while open circles correspond to data obtained by decreasing ${\it\epsilon}$, both in a quasi-stationary manner. Photographs of the corresponding film structure when viewed from above are displayed for three ($q,{\it\epsilon}$) pairs (insets).

Figure 6

Figure 6. (a) The onset of the SW instability in a single film (SF) compared to that in the stacked configuration (DF). For comparison with the experimental results (Exp), in the theoretical analysis (The), a no-slip condition (NS) or a free-slip condition (SC) is applied at the bottom of the thicker liquid layer. (b) Dominant wavenumber of the pattern as a function of the upper liquid thickness for a single film and for the stacked configuration. All data shown in (b) were obtained for ${\rm\Delta}T_{2}=3~\text{K}$, which is above the point of marginal stability. The error bars are calculated based on an error propagation method incorporating uncertainties in the temperature as well as in the film thickness measurements, whereas the uncertainties of the values used for the relevant physical properties have been neglected.

Figure 7

Figure 7. Pattern formation at the liquid–gas interface of a single layer of FC-70 on a prestructured substrate. Here, $h_{02}=880~{\rm\mu}\text{m}$ and $Ma=1000$. The structures on the lower substrate were produced in a previous step with the multilayer system, where the lower oil film was replaced by a UV-curable polymer with $h_{01}=5~{\rm\mu}\text{m}$. The polymer was solidified after the liquid–liquid interface was deformed by the BM convection in the upper FC-70 layer. In this preprocessing step, the Marangoni number of the upper layer was set to $Ma=450$. In the figure the dark spots are probably caused by light refraction at the slightly deformed liquid–gas interface. The centres of the convection cells are exactly located at the peaks of the structure of the lower substrate.

Figure 8

Figure 8. The configuration of the conjugated liquid layer system as used in the numerical analysis.

Figure 9

Table 2. Typical values of dimensionless numbers.

Figure 10

Figure 9. (a) Shear-driven LW deformation of the lower film at ${\it\tau}=250$. In the upper liquid layer the $Y$-dimension is rescaled for illustrative purposes to fit into the graph. The streamlines in the upper liquid layer and the deformation of the lower liquid layer are depicted for $Ma=83$, $h_{02}=600~{\rm\mu}\text{m}$ and $h_{01}=5~{\rm\mu}\text{m}$. (b) Time evolution of the liquid–liquid interface for the same parameters as used in (a).

Figure 11

Figure 10. Comparison of the experimental findings with the results from the mathematical model. (a) Onset of instability (marginal stability). The results of the analytical model for the free-slip condition at the bottom of the upper liquid layer (The-SC) are displayed as well. (b) Dominating pattern wavenumber at ${\rm\Delta}T_{2}=3~\text{K}$.

Figure 12

Figure 11. (a) Time evolution of the liquid–liquid interface in the absence of shear stress exerted by the upper layer for $Bo=0$, $Ca=8.3\times 10^{-3}$ and $Dy_{1}=1.43$ ($Ma_{1}=0.0067$). (b) Time evolution of the liquid–liquid interface in the absence of the transverse temperature gradient for $Bo=-4.6\times 10^{-5}$, $Ca=8.3\times 10^{-3}$ and $Dy_{1}=0$ ($Ma_{1}=0$).

Figure 13

Figure 12. (a) Numerical results for the critical Marangoni number in the upper liquid layer as a function of $\bar{h}=h_{02}/h_{01}$. (b) Shear stress $S$ at the bottom of the upper liquid layer, determined at the onset of the BM instability and scaled to its maximum value $S_{w}$ obtained for the no-slip condition, as a function of the critical Marangoni number in the upper liquid layer. In dimensionless form, the shear stress takes the maximum value of ${\it\chi}_{w}=S_{w}h_{02}^{2}/({\it\mu}_{2}{\it\alpha}_{2})=1.45$ if the no-slip condition is used at the bottom of the upper layer. (c) Ratio $S/S_{w}$ as a function of $\bar{h}$. All numerical results shown in these three plots were obtained for $h_{02}=510~{\rm\mu}\text{m}$, $\bar{{\it\mu}}=8.39$ and $Bi=0.108$.