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Jump of an atomic force microscopy probe towards an elastic substrate in a liquid environment

Published online by Cambridge University Press:  24 June 2025

Zhaohe Dai*
Affiliation:
Department of Mechanics and Engineering Science, State Key Laboratory for Turbulence and Complex Systems, College of Engineering, Peking University, Beijing 100871, PR China
*
Corresponding author: Zhaohe Dai, daizh@pku.edu.cn

Abstract

In typical atomic force microscopy (AFM) measurements, the AFM probe, mounted on a compliant cantilever, is brought into close proximity to the test substrate. At this range, interfacial attractive van der Waals (vdW) forces can deflect the cantilever by pulling the probe, often causing the probe to suddenly jump into contact with the substrate. For deformable substrates such as gels or bio-tissues, the attraction-induced substrate deformation can further reduce the gap beneath the probe, which can increase the vdW force and hence trigger jump-to-contact prematurely. Since soft gels and tissues are frequently tested in liquid environments, where surface tension and the approaching dynamics of the probe can significantly influence deformation behaviour, this study examines the statics and dynamics of jump-to-contact on elastic substrates incorporating the effect of solid surface tension. We first discuss the theoretical setting for the static problem, deriving perturbation solutions for limiting cases of small and large solid surface tension. Notably, even under conditions of large solid surface tension, elasticity remains critical, as far-field elastic forces are required to smooth surface deformations in a convergent manner. Recognising that practical experiments are inherently dynamic, we also analyse the role of hydrodynamic pressure, which can delay the premature jump-to-contact. Our analysis focuses on identifying the conditions under which dynamic effects are negligible, enabling the simple analytical solutions in the static problem to reliably interpret AFM experimental results.

Information

Type
JFM Papers
Copyright
© The Author(s), 2025. Published by Cambridge University Press
Figure 0

Figure 1.Jump-to-contact of an AFM probe with an elastic substrate influenced by surface tension. The probe, with radius $R_s$, is mounted on a cantilever of spring constant $k$. The cantilever is controlled by a holder positioned at height $d$ above the undeformed surface.

Figure 1

Figure 2.Substrate deformation and the fold bifurcation. (a) Surface deformation of the elastic substrate for various gap values, as indicated by the colour bar. Markers represent numerical results, while solid curves correspond to the analytical solution given in (3.7). Only solid markers indicate stable and physically meaningful solutions, as the gaps for empty markers fall below the critical jump gap $S_c$. (b) Gap as a function of the cantilever position for rigid (black curve, see (2.10)) and deformable (red curve, see (3.8)) substrates. Empty markers represent numerical results, while the two solid markers indicate the critical gap and the corresponding cantilever position where jump-to-contact occurs. All calculations are performed with $ \alpha = 0.01$, $ \epsilon = 0.1$ and $ \gamma = 0.1$.

Figure 2

Figure 3.Premature jump-to-contact on compliant substrates. (a) The gap under the probe and (b) the net attractive vdW force, as functions of the cantilever position for substrates with different compliances $\epsilon$ (encoded in the colour bar). Coloured empty markers represent numerical calculations, while the coloured curves are based on (2.15) and (3.8). The leftmost curve in black represents the rigid limit, as given by (2.10). Here, $\alpha =0.01$ and $\Gamma =0.1$.

Figure 3

Figure 4.The jump-to-contact point for substrates with small surface tensions ($\Gamma \ll 1$). (a) Critical attractive vdW force $\mathcal{F}_c$ and (b) critical cantilever position $D_c$, as functions of the effective compliance of the substrate $\epsilon$, as defined in (2.21). Markers represent numerical calculations, while curves correspond to the analytical solutions given in (3.10a) and (3.10b) for various surface tension values $\Gamma$. The specific values of $\Gamma$ are indicated by the colour bar. Note that the solid curves remain valid only for small $\Gamma$; at $\Gamma =10$, they exhibit significant deviations from the marker data. Here, we used $\alpha =0.01$ in numerics.

Figure 4

Figure 5.The first-order solution for the surface deformation of an elastic substrate influenced by large surface tension. The inner solution, outer solution and full solution are provided in (3.13), (3.15) and (3.17), respectively.

Figure 5

Figure 6.The effect of surface tension on the substrate deformation. (a) Surface deformation of the elastic substrate for various gap values. Markers denote numerical results, while solid curves represent the analytical solution from (3.17). (b) Gap as a function of the cantilever position for rigid (black curve, given by (2.10)) and deformable (red curve, given by (3.18)) substrates. Calculations are performed with $\alpha = 0.01$, $\epsilon = 0.05$ and $\Gamma = 10^2$ (or $\Gamma = 10^4$, with corresponding markers and curves displayed with partial transparency).

Figure 6

Figure 7.(a) The gap of the probe above the undeformed substrate and (b) the net attractive vdW force between the probe and the deformed substrate as functions of the cantilever position for substrates with different compliances $\epsilon$ (encoded in the colour bar). Coloured empty markers represent numerical calculations, while the coloured curves are based on (2.15) and (3.18). The leftmost curve in black represents the rigid limit, provided by (2.10). Here, $\alpha =0.01$ and $\Gamma =10$.

Figure 7

Figure 8.The jump-to-contact point for substrates with large surface tensions ($\Gamma \gg 1$). (a) Critical attractive vdW force $\mathcal{F}_c$ and (b) critical cantilever position $D_c$ as functions of the effective compliance of the substrate $\epsilon$, for various surface tensions. Markers represent numerical calculations, while curves correspond to the analytical solutions given in (3.19a–c). The values of corresponding surface tension are encoded in the colour bar. Note that the solid curves are valid only for large $\Gamma$. Here, $\alpha =0.01$ is used in numerics.

Figure 8

Figure 9.Delayed jump-to-contact on a rigid substrate. (a) The probe–substrate gap and (b) the net attractive force on the probe as functions of the cantilever position for different approaching velocities $\lambda$ (indicated by the colour bar). The rightmost black curve represents the static case, while the opaque coloured curves correspond to calculations with constant $\dot {D} = -1$, and the partially transparent coloured curves correspond to $\dot {S} = -1$.

Figure 9

Figure 10.Delayed jump-to-contact on a deformable substrate: the overall attractive force on the probe as functions of the cantilever position for different approaching velocities $\lambda$ (indicated by the colour bar). The black curves represent the static case, while the coloured curves correspond to calculations with constant $\dot {D} = -1$ according to (4.18). Here, we used $\epsilon =1$ for opaque curves, and $\epsilon =0$ for partially transparent curves.

Figure 10

Figure 11.Surface deformation of an elastic substrate subjected to the combined effects of vdW, Laplace and hydrodynamic pressures at order $\epsilon$. (a) Plot of (A2) with $\Gamma = 0$. (b) Plot of (A3) with $\Gamma = 100$. The value of $\lambda$ for each coloured curve is indicated in the colour bar (the black curve represents the quasi-static case). In both cases, $S=10$ and $\dot S = -1$ are used for demonstration.