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In situ transmission electron microscopy investigation on 〈c + a〉 slip in Mg

Published online by Cambridge University Press:  11 February 2019

Dalong Zhang
Affiliation:
Department of Chemical Engineering and Materials Science, University of California-Irvine, Irvine, California 92697-2575, USA
Lin Jiang
Affiliation:
Department of Chemical Engineering and Materials Science, University of California-Irvine, Irvine, California 92697-2575, USA
Xin Wang
Affiliation:
Department of Chemical Engineering and Materials Science, University of California-Irvine, Irvine, California 92697-2575, USA
Irene J. Beyerlein
Affiliation:
Mechanical Engineering Department, Materials Department, University of California-Santa Barbara, Santa Barbara, California 93106, USA
Andrew M. Minor
Affiliation:
Department of Materials Science and Engineering, University of California-Berkeley, and National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
Julie M. Schoenung
Affiliation:
Department of Chemical Engineering and Materials Science, University of California-Irvine, Irvine, California 92697-2575, USA
Subhash Mahajan
Affiliation:
Department of Materials Science and Engineering, University of California-Davis, Davis, California 95616, USA
Enrique J. Lavernia*
Affiliation:
Department of Chemical Engineering and Materials Science, University of California-Irvine, Irvine, California 92697-2575, USA
*
a)Address all correspondence to this author. e-mail: lavernia@uci.edu

Abstract

Recent molecular dynamics simulations revealed that 〈c + a〉 dislocations in Mg were prone to dissociation on the basal plane, thus becoming sessile. Basal dissociation of 〈c + a〉 dislocations is significant because it is a major factor in the limited ductility and high work-hardening in Mg. We report an in situ transmission electron microscopy study of the deformation process using an H-bar-shaped thin foil of Mg single crystal designed to facilitate 〈c + a〉 slip, observe 〈c + a〉 dislocation activity, and establish the validity of the largely immobile 〈c + a〉 dislocations caused by the predicted basal dissociation. In addition, through detailed observations on the fine movement of some 〈c + a〉 dislocations, it was revealed that limited bowing out movement for some non-basal portions of 〈c + a〉 dislocations was possible; under certain circumstances, i.e., through attraction and reaction between two 〈c + a〉 dislocations on the same pyramidal plane, at least portions of the sessile configuration were observed to be reversed into a glissile one.

Figure 0

Figure 1: (a) and (b) Post-mortem TEM for #1 H-bar deformed to relatively low strain with g = 0002 and $g = 2\bar{1}\bar{1}0$ under dark field, respectively. The white dashed line in (a) represents the trace of the basal plane.

Figure 1

Figure 2: (a) and (b) Post-mortem TEM for #2 H-bar deformed to a relatively high strain level containing 〈c〉-component dislocations with g = 0002 and $g = 2\bar{1}\bar{1}0$ under dark field, respectively. The white dashed line represents the trace of the basal plane. Some dislocations with stair-like configuration are pointed out by red arrows in (a).

Figure 2

Figure 3: (a)–(l) Snapshots of the deformation process of thicker #3 H-bar with approximate g = 0002 under bright field. The colored arrow in each snapshot acts as a fiduciary “coordinate” in space. With reference to the corresponding arrow, the movement of each dislocation in the vicinity can be better discerned. The black dashed line represents the trace of the basal plane.

Figure 3

Figure 4: (a)–(f) Snapshots of the deformation process in the later stage of thicker #3 H-bar with approximate g = 0002 under bright field. The activity of two bow-like dislocations B1 and B2 is tracked by two blue arrows. (g) and (h) Post-mortem TEM for the area of interest containing dislocations B1 and B2, as outlined by the black dashed box in (f) with g = 0002 and $g = 01\bar{1}0$ under dark field, respectively.

Figure 4

Figure 5: (a–e), snapshots of activity of D1–D3 dislocations in #4 H-bar during indentation with approximate g = 0002 under bright field. The bowing out of the newly formed dislocation D4 is tracked by red arrows in (f), (g), and (h). The white dashed line represents the trace of the basal plane.

Figure 5

Figure 6: Proposed dislocation model for the movement and reaction of dislocations D1 and D4 observed in Fig. 5. (a) D1 was nucleated, assuming the bow-like configuration. (b) D4 was also nucleated on the same pyramidal plane as D1, assuming the bow-like configuration as well. (c) The adjacent glissile ends of D1 and D4 attracted each other, leading to a “pinched out” glissile Dc and a half loop of sessile Dr. Dc was able to further bow out.

Figure 6

Figure 7: A representative H-bar of Mg single crystal showing different views. (a) Cross-section view in SEM, showing the thickness of the H-bar, which is typically ∼300 nm. (b) Planar view in SEM, showing that the planar dimension of the H-bar is ∼5 µm × ∼5 µm. (c) Planar view in TEM, showing the size of the H-bar as compared with the conical ∼1 µm tip of the indenter.

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