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Reliability of temperature determination from curve-fitting in multi-wavelength pyrometery

Published online by Cambridge University Press:  09 July 2013

P.A. Ni*
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California
R.M. More
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California
F.M. Bieniosek
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California
*
Address correspondence and reprint requests to P.A. Ni, Lawrence Berkeley National Laboratory, Berkeley, CA 94720. E-mail: pani@lbl.gov

Abstract

This paper examines the reliability of a widely used method for temperature determination by multi-wavelength pyrometry. In recent warm dense matter experiments with ion-beam heated metal foils, we found that the statistical quality of the fit to the measured data is not necessarily a measure of the accuracy of the inferred temperature. We found a specific example where a second-best fit leads to a more realistic temperature value. The physics issue is the wavelength-dependent emissivity of the hot surface. We discuss improvements of the multi-frequency pyrometry technique, which will give a more reliable determination of the temperature from emission data.

Information

Type
Research Article
Copyright
Copyright © Cambridge University Press 2013 
Figure 0

Fig. 1. (Color online) Absolute emission spectrum as a function of time from a beam heated Au target by NDCX-I. Temperature is determined from spectrum at each moment of time. Lines correspond to collisional Au-I vapor excitation by ion beam.

Figure 1

Fig. 2. (Color online) (a) Best fit (with a fitted temperature T = 7200 K) of the spectrometer data (from the data in Fig. 1b) using an emissivity assumed to have a quadratic form. (b) Inferred best-fit emissivity as function of wavelength.

Figure 2

Fig. 3. (Color online) (a) Second “best” fit of the spectrometer data (with a fitted temperature T = 2400 K) (from the data in Fig. 1b) using an emissivity assumed to have a quadratic form. (b) Inferred fit emissivity as function of wavelength. The parameters derived in figure are also at a minimum in the mean square deviation, but have a larger deviation (worse fit) than those in Figure 2.