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High-charge divergent electron beam generation from high-intensity laser interaction with a gas-cluster target

Published online by Cambridge University Press:  27 April 2015

P. Koester*
Affiliation:
Intense Laser Irradiation Laboratory, Istituto Nazionale di Ottica, Consiglio Nazionale delle Ricerche, Pisa, Italy
G.C. Bussolino
Affiliation:
Intense Laser Irradiation Laboratory, Istituto Nazionale di Ottica, Consiglio Nazionale delle Ricerche, Pisa, Italy
G. Cristoforetti
Affiliation:
Intense Laser Irradiation Laboratory, Istituto Nazionale di Ottica, Consiglio Nazionale delle Ricerche, Pisa, Italy
A. Faenov
Affiliation:
Joint Institute for High Temperatures, Russian Academy of Science (RAS), Moscow, Russia Division for Photon Science and Technology, Institute for Academic Initiatives, Osaka University, Osaka, Japan
A. Giulietti
Affiliation:
Intense Laser Irradiation Laboratory, Istituto Nazionale di Ottica, Consiglio Nazionale delle Ricerche, Pisa, Italy
D. Giulietti
Affiliation:
Dipartimento di Fisica, Università di Pisa, Pisa, Italy INFN Sezione di Pisa, Pisa, Italy
L. Labate
Affiliation:
Intense Laser Irradiation Laboratory, Istituto Nazionale di Ottica, Consiglio Nazionale delle Ricerche, Pisa, Italy INFN Sezione di Pisa, Pisa, Italy
T. Levato
Affiliation:
Intense Laser Irradiation Laboratory, Istituto Nazionale di Ottica, Consiglio Nazionale delle Ricerche, Pisa, Italy Fyzikální ústav AV ČR v.v.i., Praha, Czech Republic
T. Pikuz
Affiliation:
Joint Institute for High Temperatures, Russian Academy of Science (RAS), Moscow, Russia Graduate School of Engineering, Osaka University, Osaka University, Osaka, Japan
L.A. Gizzi
Affiliation:
Intense Laser Irradiation Laboratory, Istituto Nazionale di Ottica, Consiglio Nazionale delle Ricerche, Pisa, Italy INFN Sezione di Pisa, Pisa, Italy
*
Address correspondence and reprint requests to: P. Koester, Consiglio Nazionale delle Ricerche – Istituto Nazionale Ottica, Via Moruzzi 1, 56124 Pisa, Italy. E-mail: petra.koester@ino.it

Abstract

We report on an experimental study on the interaction of a high-contrast 40 fs duration 2 TW laser pulse with an argon-cluster target. A high-charge, homogeneous, large divergence electron beam with moderate kinetic energy (~2 MeV) is observed in the forward direction. The results show that an electron beam with a charge as high as 12 nC can be obtained using a table-top laser system. It was demonstrated that the accelerated electron beam is suitable for a variety of applications such as micro-radiography of thin samples in a wide field of view. It can also be applied for in vitro dosimetry studies.

Information

Type
Research Article
Copyright
Copyright © Cambridge University Press 2015 
Figure 0

Fig. 1. Experimental setup. (1) Lanex screen used for the electron spatial distribution measurements; (2) magnetic spectrometer used for the measurements of the electron energy distribution; (3) Gafchromic film used for the electron beam charge measurements; (4) a complex object was placed in contact with the radiochromic film detector for e-radiography.

Figure 1

Fig. 2. Typical spatial distribution of the accelerated electron beam as detected by the scintillating screen at a distance of 15 cm from the gas-jet nozzle. The electron beam was obtained from the interaction of a 40 fs laser pulse at an intensity of 1.7 × 1018 W/cm2 with an Ar-cluster target at a backing pressure of 46 bar (top) and an He gas target at a backing pressure of 40 bar (bottom).

Figure 2

Fig. 3. Radial lineouts of the spatial distributions in Figure 2. The data obtained from the interaction with an Ar-cluster target was fitted with a Gaussian function (a) and the data obtained from the interaction with an He gas target with the sum of a Gaussian and a linear function (b).

Figure 3

Fig. 4. Typical energy distribution of the electron beam obtained from the interaction of a 40 fs laser pulse at an intensity of 2 × 1018 W/cm2 with an Ar-cluster target (backing pressure 46 bar). The sharp cut toward lower energies is due to the spectral limit of our spectrometer.

Figure 4

Fig. 5. Energy released in the active layers of a GAFCHROMIC MD-55 film as a function of incoming electron kinetic energy. The results are obtained from Monte Carlo simulations using Geant4 libraries for the experimental setup including an Al filter of 15 μm thickness.

Figure 5

Fig. 6. Contact radiography performed with the electron beam obtained from the interaction of the laser pulse with the Ar-cluster target. Top left: Detail showing the radiography of two layers of a 10 μm thick Ni foil. The difference in absorption of 20 μm of Ni (light area), 10 μm of Ni (center diagonal), and no Ni (dark area) is visible. Bottom left: Lineout of the radiography in the top left panel along the black line. Top right: Photograph of one of the samples used for radiography. Bottom right: Detail (the leaf at the center) of the radiography of the sample in the top right panel. The internal structure of the leaf is visible.

Figure 6

Fig. 7. Cluster density as a function of Ar gas backing pressure.