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Measuring the volume charge in dielectric films using single frequency electro-acoustic waves

Published online by Cambridge University Press:  03 March 2014

Dongfei Pei
Affiliation:
Plasma Processing and Technology Laboratory and Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706
Yuri M. Shkel
Affiliation:
Commet LLC, Fitchburg, Wisconsin 53711
Daniel J. Klingenberg
Affiliation:
Department of Chemical and Biological Engineering and Rheology Research Center, University of Wisconsin, Madison, Wisconsin 53706
Zakai I. Segal
Affiliation:
Plasma Processing and Technology Laboratory and Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706
Yoshio Nishi
Affiliation:
Department of Electrical Engineering Stanford University, Stanford, California 94305
J. Leon Shohet*
Affiliation:
Plasma Processing and Technology Laboratory and Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706
*
a) Address all correspondence to this author. e-mail: shohet@engr.wisc.edu

Abstract

An electro-acoustic method for measuring volume charge distributions in dielectric films (50 μm–0.2 mm thick) is described. A high voltage (>1 kV) sinusoidal signal (frequency ∼ 2 kHz) is applied across the dielectric sample. The charges inside the dielectric material will mechanically respond to the input electric signal and excite acoustic waves. The acoustic waves can be detected and measured using a piezoelectric sensor. By analyzing the received acoustic signal, we are able to compare the amount of charge in various samples.

Information

Type
Articles
Copyright
Copyright © Materials Research Society 2014 
Figure 0

FIG. 1. Theoretical model for the SEA measurement. The dielectric with a continuous charge distribution of ρ(x) is between two electrodes with a high voltage sinusoidal signal applied. The acoustic sensor is on the left side of the grounded electrodes.

Figure 1

FIG. 2. Simulation of PEA and SEA methods with a single layer charge distribution: (a) the charge distribution; (b) the output signal from of the PEA method; (c) the output signal from the SEA method; and (d) the modified output signal from SEA method with the second harmonic removed.

Figure 2

FIG. 3. The experiment setup for SEA measurement. Copper layers are inserted to simulate the layers of charge. (a) Measurement with a single layer of charge. The location of the charging layer can be controlled by changing the values of d1 and d2. The charge density is controlled by the d.c. voltage source U0. (b) Measurement with two layers of charge. The locations of the charging layers are controlled by t1, t2, and t3. The charge density is controlled by the d.c. voltage sources U1 and U2.

Figure 3

FIG. 4. Signal from the piezo sensor and the input signal for different situations. The thinner curves are the input signals from the HV source. The thicker curves are the signal from the piezo-sensor. (a) No charge inside the dielectric. (b) There is a positive charge inside the dielectric.

Figure 4

FIG. 5. Output signal with different charge amounts using 1 kHz input signal.

Figure 5

FIG. 6. Measurements with single charge layer at different locations. Output of first harmonic amplitude with different positions of the charge layer. Layer 1: d1 = 0.05 mm, d2 = 0.10 mm; Layer 2: d1 = 0.10 mm, d2 = 0.05 mm.

Figure 6

FIG. 7. Measurement results with two charge layers. The total amount of charge on the two layers is fixed to three different values, and the distribution of charge between the two layers varies. (The charge density on one layer may exceed the total amount of charge because the other layer may carry negative charge.)