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Microstructures and nanostructures in long-term annealed AgPb18SbTe20 (LAST-18) compounds and their influence on the thermoelectric properties

Published online by Cambridge University Press:  05 August 2011

Jayaram Dadda*
Affiliation:
Institute of Materials Research, German Aerospace Center (DLR), D-51170 Köln, Germany
Eckhard Müller
Affiliation:
Institute of Materials Research, German Aerospace Center (DLR), D-51170 Köln, Germany
Susanne Perlt
Affiliation:
Leibniz Institute of Surface Modification (IOM), D-04318 Leipzig, Germany
Thomas Höche
Affiliation:
Leibniz Institute of Surface Modification (IOM), D-04318 Leipzig, Germany
Paula Bauer Pereira
Affiliation:
Forschungszentrum Jülich GmbH, IFF, JNCS and JARA-FIT, D-52425 Jülich, GermanyFaculty of Sciences, University of Liège, B-4000 Liège, Belgium
Raphaël P. Hermann
Affiliation:
Forschungszentrum Jülich GmbH, IFF, JNCS and JARA-FIT, D-52425 Jülich, GermanyFaculty of Sciences, University of Liège, B-4000 Liège, Belgium
*
a)Address all correspondence to this author. e-mail: jayaram.dadda@dlr.de

Abstract

This article reports on the role of annealing on the development of microstructure and its concomitant effects on the thermoelectric properties of polycrystalline AgPbmSbTe2+m (m = 18, lead–antimony–silver–tellurium, LAST-18) compounds. The annealing temperature was varied by applying a gradient annealing method, where a 40-mm-long sample rod was heat treated in an axial temperature gradient spanning between 200 and 600 °C for 7 days. Transmission electron microscopy investigations revealed Ag2Te nanoparticles at a size of 20–250 nm in the matrix. A remarkable reduction in the thermal conductivity to as low as 0.8 W/mK was also recorded. The low thermal conductivity coupled with a large Seebeck coefficient of ∼320 μV/K led to high ZT of about 1.05 at 425 °C for the sample annealed at 505 °C. These results also demonstrate that samples annealed above 450 °C for long term are more thermally stable than those treated at lower temperatures.

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Articles
Copyright
Copyright © Materials Research Society 2011
Figure 0

FIG. 1. Schematic of the experimental setup for long-term annealing treatment in a temperature gradient. T1 = 600 °C and T2 = 200 °C.

Figure 1

FIG. 2. Seebeck scans at room temperature taken at the surface of a cylindrical bar undergoing gradient annealing; left: before (as-sintered) and right: post annealing treatment. (a) Histogram [abundance distribution of Seebeck values occurring in the scan (b)]. (b) Area scans of the Seebeck coefficient obtained in the as-sintered condition. (c) Surface scans of the Seebeck coefficient and (d) microhardness values of the bar along its axis after annealing in a temperature gradient between 200 and 600 °C. According to the given temperature profile [blue line in (c)] that was maintained in the bar over 1 week, the temperature of annealing at the respective positions is indicated by an arrow in (c). (e) The schematic shows the disc samples and corresponding annealing temperatures that were used for material characterization as a function of annealing temperature.

Figure 2

FIG. 3. Micrographs of (a) as-quenched and (b) as-sintered samples and samples annealed at (c) 360 °C (d) 410 °C (e) 505 °C, and (f) 580 °C. It should be noted that annealing temperatures were chosen depending upon the location of cross-sectional discs carved out from the cylindrical bar annealed in a temperature gradient [cf. Fig. 2(e)].

Figure 3

FIG. 4. (a) A backscattered electron image and (b) energy dispersive spectroscopy (EDS) qualitative mapping of Ag, Sb, Pb, and Te in a microstructure recorded at a sample annealed at 238 °C for 1 week.

Figure 4

TABLE I. Energy dispersive spectroscopy analysis of as-quenched sample.

Figure 5

TABLE II. Energy dispersive spectroscopy analysis of annealed samples.

Figure 6

FIG. 5. The variation of (a) chemical composition of Ag and Sb in the matrix phase and the (b) Ag/Sb concentration ratio as a function of annealing temperatures. The horizontal line in (a) refers to the nominal composition of Ag and Sb in LAST-18 compound. (c) Volume fraction of secondary phases in the main phase against Sb content in the matrix for a given annealing condition.

Figure 7

FIG. 6. Comparison of the powder x-ray diffraction patterns of an as-quenched sample and a sample annealed at 505 °C for 7 days.

Figure 8

FIG. 7. (a) Bright-field image of an annealed sample at 238 °C for 7 days showing large Ag2Te and Sb precipitates as well as smaller Ag2Te precipitates as marked by the white arrow. (b) The domain structures resembling twins in an Ag2Te precipitate in the LAST matrix. (c) A bright-field image of a sample annealed at 505 °C for 1 week displaying nano Ag2Te precipitates in a scale of 20–80 nm. (d) A transmission electron microscope image of a sample that was annealed at 580 °C for 1 week showing a homogeneous matrix. The inset in (d) is a selected area electron diffraction pattern obtained after tilting the foil to the [111] zone axis confirming the cubic structure of the material. (e) A high resolution transmission electron microscopy image obtained from the sample in (d) showing nanostructural features in the matrix.

Figure 9

FIG. 8. Temperature- and annealing temperature-dependent (a) electrical conductivity, (b) Seebeck coefficient, (c) electrical resistivity recorded during heating and cooling cycles for the sample annealed at 360 °C for 7 days, and (d) power factor. The resistivity data are shown here in (c) to highlight the phase transformation behavior in Ag2Te precipitates.

Figure 10

FIG. 9. Temperature-dependent (a) total thermal conductivity and (b) lattice thermal conductivity for several annealed samples.

Figure 11

FIG. 10. Dimensionless thermoelectric figure of merit (ZT) as function of annealing temperatures.