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The effect of substrate pore size on the network interconnectivity and electrical properties of dropcasted multiwalled carbon nanotube thin films

Published online by Cambridge University Press:  07 June 2013

Rachel L. Muhlbauer
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0245
Salil M. Joshi
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0245
Rosario A. Gerhardt*
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0245
*
a)Address all correspondence to this author. e-mail: rosario.gerhardt@mse.gatech.edu

Abstract

Four-layer multiwalled carbon nanotube (MWNT) thin films were deposited via dropcasting (1 mg/mL MWNTs and 10 mg/mL SDBS) onto filter papers that vary in pore size (1, 5, 25, and 40 µm) to determine the effect of the underlying substrate structure on the in-plane properties of the films. The films (<100 nm thick) were dried using vacuum filtration, and drying in a 65 °C heater with and without a ceramic heating board. DC resistance of the films ranged from 6 × 103 to 9.3 × 109 Ω. Impedance spectroscopy analysis revealed a low and a high frequency inductive response and two parallel R–C circuits for the more conducting thin films. High resistance films were fit by a single RC circuit with a constant-phase element. The differences in the in-plane electrical responses of the different MWNT films can be explained by the degree of carbon nanotube surface coverage, obtained as a result of using different pore size filter papers. The drying method utilized also affected the CNT network formation and its resultant electrical properties.

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Type
Articles
Copyright
Copyright © Materials Research Society 2013 
Figure 0

FIG. 1. Transmission electron microscopy image of MWNTs used in this study. The scale bar reads 100 nm.

Figure 1

TABLE I. Average DC resistance values and standard deviation for 1- to 4-layer MWNT films deposited on the 410 filter paper and dried using three different methods.

Figure 2

FIG. 2. SEM micrographs for 4-layer films deposited using the different drying techniques on the 413 and 415 papers. (a) Vacuum filtration on the 413 paper; (b) enhanced dry on the 413 paper; (c) 65 °C dry on the 413 paper; (d) vacuum filtration on the 415 paper; (e) enhanced dry on the 415 paper; (f) 65 °C dry on the 415 paper. The scale bars read 1 µm in all cases.

Figure 3

FIG. 3. Nyquist plots calculated using MATLAB for the vacuum-filtered samples on all filter papers. The inset shows the corresponding Nyquist plots for vacuum-filtered films on the 410 and 413 filter papers, which are orders of magnitude smaller than the plots for the films deposited onto 415 and 417 filter papers shown in the main image.

Figure 4

FIG. 4. Representative Nyquist plots determined using MATLAB showing the trend for the enhanced dry samples. As the pore size increases, the magnitude of the graph increases as well. Data taken for the CNT-TFs made by 65 °C dry showed the same trends for all of the filter papers (not shown).

Figure 5

FIG. 5. Equivalent circuits used to fit all of the impedance data: (a) the “nested-RL” circuit for all enhanced dry samples, 65 °C dry samples, and the films deposited through vacuum filtration on the 410 and 413 papers. (b) The CPE-containing circuit, which fits the impedance data found for vacuum-filtered films on the 415 and 417 papers.

Figure 6

TABLE II. Equivalent circuit values for the more conducting films whose response can be fitted by the nested-RL-containing circuit (e.g., averages displayed in Fig. 4, in the inset of Fig. 3 as well as 65 °C dry films not shown in figures).

Figure 7

FIG. 6. SEM image of the coiled CNTs wrapping around a paper fiber from the 413 vacuum-filtered sample. The scale bar reads 200 nm.

Figure 8

TABLE III. Equivalent circuit values for the more insulating films whose response can be fitted to the CPE-containing circuit (e.g., data displayed in main part of Fig. 3).