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Texture analysis of manganese-germanide/germanium nanowire heterostructures by high resolution electron microscopy and diffraction

Published online by Cambridge University Press:  26 July 2011

E.R. Hemesath
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208
J.L. Lensch-Falk
Affiliation:
Materials Physics Department, Sandia National Laboratories, Livermore, California 94550
L.J. Lauhon*
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208
*
a)Address all correspondence to this author. e-mail: lauhon@northwestern.edu

Abstract

Syntaxial growth of Mn11Ge8/Ge nanowire heterostructures was carried out using a vapor–solid–solid (VSS) growth process, and transmission electron microscopy imaging and selected-area electron diffraction were used to study the structure, orientation, and interface of each phase. Preferred crystallographic relationships were found to exist between the Mn11Ge8 seeds, which exhibit a single uniaxial growth direction, and the seeded Ge nanowires, which exhibit multiple growth directions. The crystallographic relationships for individual nanowire heterostructures were characterized in the context of microtexture analysis, which has not previously been applied to nanowire heterostructures. Fiber and off-normal fiber textures were predominant, although examples of epitaxial and uniaxial in-plane textures were also identified. Microtexture analysis of VSS-grown nanowire systems is shown to provide a useful perspective on the products of synthesis that can lead to new insights into growth mechanisms.

Information

Type
Articles
Copyright
Copyright © Materials Research Society 2011
Figure 0

FIG. 1.(a) Schematic of Mn11Ge8/Ge nanowire heterostructure. (b)–(e) Heterostructures with distinct orientations. Scale bars are 20 nm. (b) Germanide that grew parallel to the Ge growth axis. Germanides with other orientations were also observed: (c) 10°, (d) 20°, and (e) 35°.

Figure 1

FIG. 2.(a) TEM image of an epitaxial heterostructure. The irregular border is a result of carbon contamination from imaging. Diffraction patterns from the two crystals are given in the inset. In (b), the Ge diffraction pattern (green spots) is overlaid on that of the Mn11Ge8 to demonstrate the registry between planes (green arrows) perpendicular to the growth interface. Scale bars are 50 nm and 5 nm−1 for (a) and (b), respectively.

Figure 2

FIG. 3.(a) TEM image of the region near the interface between Ge and Mn11Ge8 nanowires. Diffraction pattern of (b) the Ge nanowire only, (c) both crystals combined, and the (d) leader only. The Ge nanowire grows along a <110> direction, whereas the leader is oriented along a <001> direction, which corresponds to a <112> direction in the Ge. Green (purple) arrows indicate the growth axis of the Ge (Mn11Ge8) in both the image and the diffraction patterns. Scale bars are 25 nm and 10 nm−1 for (a) and (b)-(d), respectively.

Figure 3

FIG. 4.(a) Diffraction patterns from a single Mn11Ge8/Ge heterostructure with leader data (a, c, e) on the left and wire patterns (b, d, f) on the right. The data was collected as the leader was rotated about its axis to three different zone axis orientations. The {002} planes (perpendicular to the growth axis) are along the horizontal axis for all images.