Hostname: page-component-74656f9884-2dmjx Total loading time: 0 Render date: 2026-11-08T00:04:40.941Z Has data issue: false hasContentIssue false

In situ elevated temperature transmission electron microscopy of sensitized aluminum–magnesium alloy treated by ultrasonic impact treatment

Published online by Cambridge University Press:  15 July 2014

Kim N. Tran*
Affiliation:
Survivability, Structures, and Materials, Naval Surface Warfare Center, Carderock Division, West Bethesda, Maryland 20817, USA
Lourdes Salamanca-Riba
Affiliation:
Materials Science and Engineering Department, University of Maryland, College Park, Maryland 20742, USA
Wen-An Chiou
Affiliation:
Nanoscale Imaging, Spectroscopy, and Properties Laboratory, NanoCenter, University of Maryland, Maryland 20742, USA
*
a) Address all correspondence to this author. e-mail: kimngoc.tran@navy.mil

Abstract

In situ transmission electron microscopy (TEM) analysis shows that submicrometer grains formed by ultrasonic impact treatment (UIT) of sensitized 5456-H116 Al–Mg alloy products are thermally stable up to ∼300 °C which is consistent with previous research on annealing of heavily deformed Al–Mg. Grain growth occurs above 300 °C with significant growth at ∼400 °C. Grain growth continued upon heating to 450 °C; the grain size did not significantly increase when the temperature was held at 450 °C long term. In situ TEM revealed a duplex microstructure that was not fully recrystallized. The activation energy for grain growth was determined to be ∼32 kJ/mol. The submicrometer grains produced by UIT offer improved resistance to fatigue and corrosion. The majority of sensitized 5456-H116 failures are sensitive to the material's surface properties and operational service temperature; the stability of the submicrometer grains in the UIT Al–Mg makes them more stable in practical operations where increase in the material temperature is an issue.

Information

Type
Articles
Copyright
Copyright © Materials Research Society 2014 
Figure 0

FIG. 1. (a) DF TEM micrographs of UIT 5456 at room temperature (RT) showing the presence of submicrometer grains and (b) grain growth at 300 °C. The insets in the bottom right are the diffraction pattern from the areas.

Figure 1

FIG. 2. DF TEM micrographs of UIT 5456 at 350 and 400 °C showing the presence of submicrometer grains and grain growth. The inset at the bottom of the left image is the diffraction pattern of the area and shows typical ring pattern characteristic of submicrometer grains with some strong spots indicating grain growth at 350 °C.

Figure 2

FIG. 3. DF TEM micrographs of UIT 5456 (a) at 450 °C showing significant grain growth and (b) cooled to room temperature after heating to 450 °C showing stable grain growth. The insets at the bottom right of each figure are the diffraction patterns of the areas.

Figure 3

FIG. 4. DF images of UIT 5456 heated to 450 °C and held for various lengths of time following significant grain growth; holding for 40 min did not result in further grain growth.

Figure 4

FIG. 5. Semilogarithmic plot of (d2 − d02) versus 1/T for grain growth from in situ heating TEM of UIT material; Slope of the line is Q/2.3R.