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Spectroscopic imaging in piezoresponse force microscopy: New opportunities for studying polarization dynamics in ferroelectrics and multiferroics

Published online by Cambridge University Press:  27 July 2012

R.K. Vasudevan*
Affiliation:
School of Materials Science and Engineering, University of New South Wales, Kensington, NSW 2052, Australia
S. Jesse
Affiliation:
Centre for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TENNESSEE 37831
Y. Kim
Affiliation:
Centre for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TENNESSEE 37831
A. Kumar
Affiliation:
Centre for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TENNESSEE 37831
S.V. Kalinin*
Affiliation:
Centre for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TENNESSEE 37831
*
*Address all correspondence to R.K. Vasudevan and S.V. Kalinin at ramav@student.unsw.edu.au and sergei2@ornl.gov
*Address all correspondence to R.K. Vasudevan and S.V. Kalinin at ramav@student.unsw.edu.au and sergei2@ornl.gov

Abstract

Piezoresponse force microscopy (PFM) has emerged as a powerful tool to characterize piezoelectric, ferroelectric, and multiferroic materials on the nanometer level. Much of the driving force for the broad adoption of PFM has been the intense research into piezoelectric properties of thin films, nanoparticles, and nanowires of materials as dissimilar as perovskites, nitrides, and polymers. Recent recognition of limitations of single-frequency PFM, notably topography-related cross-talk, has led to development of novel solutions such band-excitation (BE) methods. In parallel, the need for quantitative probing of polarization dynamics has led to emergence of complex time- and voltage spectroscopies, often based on acquisition and analysis of multidimensional datasets. In this perspective, we discuss the recent developments in multidimensional PFM, and offer several examples of spectroscopic techniques that provide new insight into polarization dynamics in ferroelectrics and multiferroics. We further discuss potential extension of PFM for probing ionic phenomena in energy generation and storage materials and devices.

Information

Type
Prospectives Articles
Copyright
Copyright © Materials Research Society 2012
Figure 0

Figure 1. BE-PFM imaging. (a) The concept of the BE-waveform, as opposed to a single frequency measurement, in the time domain and in Fourier space. (b) Example of a single-point measurement, with raw data plotted as open circles and fitted data as solid lines. (c) A single line scan across a grain boundary, with the y-axis representing the measurement frequency. (d) Extracted profiles of amplitude, resonance frequency, and quality factor (obtained after fitting) of this line. (Images taken with the Asylum Research MFP-3D™ AFM.)

Figure 1

Figure 2. Demonstration of BE-PFM is shown in (a–c), with (a) topography, (b) BE-PFM vertical amplitude and (c) phase, along with (d) resonance, and (e) Q-factor for a collection of BFO nanocapacitors. Scale bar is 400 nm. Reprinted (adapted) with permission from Kim et al.[81] Copyright (2011) American Chemical Society.

Figure 2

Table 1. Development of multidimensional PFM spectroscopies.

Figure 3

Figure 3. BE piezoforce spectroscopy (BEPS). (a) The general DC waveform for a measurement, with the probing AC waveform shown in inset (overlaid). The measurement can be off-field (τ1) or on-field (τ2). (b) Schematic of various fitting parameters that can be derived from a hysteresis loop. (c) A typical response from a single-point BEPS measurement. (d) Extracted piezoresponse and cantilever resonance loops from the single-point measurement in (c). Part (a) is adapted by permission from Macmillan Publishers Ltd.: Nature Materials (Jesse et al.[91]), copyright (2008).

Figure 4

Figure 4. BEPS mapping. An example of this technique used in a mapping experiment is shown in (a–f). The in-plane PFM image (a) before and (b) after the experiment (the red dot signifies the drift of the scanner). The extracted (b) positive and (e) negative nucleation bias maps in this region. The dataset was further analyzed along the dotted white lines, with plots of ∂PR/∂V for (c) positive and (f) negative voltages along the line. Reprinted by permission from Macmillan Publishers Ltd.: Nature Nanotechnology[119], copyright (2009).

Figure 5

Figure 5. Using BE methods to decipher collective interactions at the nanoscale. (a) 2D spectrogram of cantilever response at a single point as a function of AC bias. (b) Extracted amplitude versus bias curve. (c) The derivative is plotted, showing a linear dependence characteristic of the Rayleigh Law, for several datasets. (d) Nonlinearity maps for four PZT capacitor samples which differ in thickness (green and red colors indicate regions of high nonlinearity). It can be seen that as the thickness of the sample increases, clusters displaying nonlinear amplitude response increase in size. Adapted and reprinted with permission from Bintachitt et al.[102] Copyright National Academy of Sciences (2010).

Figure 6

Figure 6. FORC measurements using BE. (a) A triangular waveform of increasing amplitude is applied to the tip, with the BE response measured. (b) Vertical PFM amplitude of BFO nanoislands. The FORC data from the two areas marked in (b) by (c) blue and (d) black dots are shown. Reprinted (adapted) with permission from Kim et al.[127] Copyright (2011) American Chemical Society.

Figure 7

Figure 7. Demonstration of dynamic SS-PFM. (a) The DC waveform (pink) and the response of the system (plotted in multicolor, as a function of time after the pulse). (b) The spectrogram response for a complete waveform at a single point. (c) OP-PFM image of a PZT film, with loops at (d) point 1 and (e) point 2. Reprinted with permission from Kumar et al.[117] Copyright 2011, American Institute of Physics.

Figure 8

Figure 8. Relaxation mapping example. Fitting maps for parameters Ar1, τD, and Ar0 for the region in Fig. 8 at (a–c) V = −1 V and (d–f) V = 8 V. Reprinted with permission from Kumar et al.[117] Copyright 2011, American Institute of Physics.