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Thermal-conductivity measurement by time-domain thermoreflectance

Published online by Cambridge University Press:  10 October 2018

David G. Cahill*
Affiliation:
Department of Materials Science and Engineering, Materials Research Laboratory, University of Illinois at Urbana-Champaign, USA; d-cahill@illinois.edu

Abstract

The flow of heat in materials is generally perceived to be a slow process and, therefore, pump-probe techniques originally developed for ultrafast time-resolved optical spectroscopy are not an obvious source of technologies for advances in thermal-property measurements. Nevertheless, over the past 18 years, the work of approximately 30 dedicated students and postdoctoral researchers at the University of Illinois at Urbana-Champaign has developed time-domain thermoreflectance (TDTR) into a nearly universal, high-throughput tool for measuring the thermal conductivity of materials and the thermal conductance of materials interfaces. This article illustrates the utility of TDTR and surveys current topics in the science of heat conduction in materials with recent examples drawn from high-thermal-conductivity crystals of cubic boron phosphide and boron arsenide, structure–property relationships for thermal conductivity of amorphous polymers, and thermal conductivity switching in liquid-crystal networks.

Information

Type
Technical Feature
Copyright
Copyright © Materials Research Society 2018 
Figure 0

Figure 1. Schematic diagram of the optical layout of a time-domain thermoreflectance apparatus. In this layout, a “two-tint” approach using sharp-edged optical filters spectrally separates the pump and probe.18

Figure 1

Figure 2. Calculations of the temperature response of the surface of a sample in a thermoreflectance experiment. The sample geometry is 80-nm Al deposited on 500-nm-thick a-SiO2 layer on Si. The repetition rate of the laser is 80 MHz and the modulation frequency of the pump beam is 5 MHz. This calculation only considers the fundamental Fourier component of the modulation frequency. The temperature response is labeled for two delay times, td = 100 ps and 4 ns.

Figure 2

Figure 3. (a) Scanning electron microscope image of a BAs crystal grown by a chemical-vapor-transport method.1 (b) Dark-field optical microscope image of an Al-coated BAs crystal collected by the camera in the time-domain thermoreflectance system. The bright spot near the bottom is the pump laser spot with 1/e2 intensity radius of 11 μm. (c) Thermal conductivity of four BAs crystals and comparisons to the theoretical calculations in References 26 and 27. Roman numerals indicate sample numbers. The curve labeled “3ph” is a calculation limited to three-phonon scattering. The curve labeled “3ph + 4ph” refers to a calculation that considers both three-phonon and four-phonon scattering.1

Figure 3

Figure 4. Absolute value of the sensitivity with respect to the thermal conductivity (solid lines) and heat capacity (dashed lines) of a typical polymer film as a function of modulation frequency and delay time between pump and probe (black lines are t = 400 ps, red lines are t = 4 ns). The sensitivities are calculated for a 100-nm polymer film sandwiched between a 90-nm Al transducer and a Si substrate.2

Figure 4

Figure 5. Comparison between the measured thermal conductivity and the predicted value based on the model of the minimum thermal conductivity for a variety of polymer structures.2,3,33

Figure 5

Figure 6. (a) Schematic illustration of time-domain thermoreflectance measurement of a liquid-crystal-network/Al/polyimide/sapphire sample in a magnetic field. (b) Thermal conductivity of a parallel aligned (B||) liquid-crystal network in response to an orthogonal magnetic field (B⊥) at 150°C. The magnetic field was switched to the perpendicular direction (B⊥) at 150°C at t = 0 s.4