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Progress in organic single-crystal field-effect transistors

Published online by Cambridge University Press:  14 January 2013

Ignacio Gutiérrez Lezama
Affiliation:
Department of Condensed Matter Physics, École de Physique, Geneva, Switzerland; Ignacio.gutierrez@unige.ch
Alberto F. Morpurgo
Affiliation:
Department of Condensed Matter Physics, École de Physique, Geneva, Switzerland; Alberto.morpurgo@unige.ch

Abstract

Research on organic thin-film transistors tends to focus on improvements in device performance, but very little is understood about the ultimate limits of these devices, the microscopic physical mechanisms responsible for their limitations, and, more generally, the intrinsic transport properties of organic semiconductors. These topics are now being investigated through the study of transport in organic transistors realized using molecular single crystals of unprecedented chemical purity and structural quality. These studies are elucidating detailed microscopic aspects of the physics of organic semiconductors and corresponding devices and have also led to unforeseen high values for carrier mobility in these materials. Here, we discuss developments in this area and present a brief outlook on future goals that have come into experimental reach.

Information

Type
Research Article
Copyright
Copyright © Materials Research Society 2013
Figure 0

Figure 1. (a–c) Optical micrographs illustrating the time evolution of the spontaneous adhesion of a rubrene single crystal to an SiO2 substrate during lamination.19 (d–f) Optical micrographs offering a top view of several single-crystal field-effect transistors. (d) Rubrene singe crystal laminated on top of a polydimethylsiloxane stamp covered with a gold layer. The gate electrode is recessed, hence vacuum acts as the dielectric.34 (e) Similar device as in (d) made with a tetramethyl tetraselena fulvalene single crystal.26 (f) N,N′-bis(n-alkyl)-(1,7 and 1,6)-dicyanoperylene-3,4:9,10-bis(dicarboximide), n-type single-crystal laminated onto a cytop (amorphous fluoropolymer) film.27 The scale bars in (a–e) are 200 μm; in (f) it is 100 μm.

Figure 1

Figure 2. Transport through short-channel rubrene field-effect transistors with Cu electrodes. Notice in (a) how many different transistors can easily be realized on a same single crystal. (b) The source/drain current-voltage characteristics (ISD–VSD) (symbols) of these devices, measured at different temperatures (T), can be modeled in terms of two oppositely biased Schottky diodes, using the conventional Schottky theory (solid lines).36 (c) The bias-dependence of the Schottky barrier height (EA, circles) can also be reproduced using the same theory36 (solid line). (d) Short-channel devices show a length-dependent threshold voltage shift (δVT (L), circles) due to charge-transfer from the metal contacts, which becomes non-negligible for submicron channel lengths (L).37 The length dependence of the threshold voltage can be accounted for quantitatively using the known range of Schottky barrier heights, 0.13 eV (dashed line) and 0.15 eV (solid line) obtained from the study of the contact resistance performed on the same devices.

Figure 2

Figure 3. Band-like transport in single-crystal field-effect transistors laminated on top of gold-covered polydimethylsiloxane stamps (similar to those shown in Figure 1), in which single crystals of tetramethyl tetraselena fulvalene (TMTSF),26N,N′-bis(n-alkyl)-(1,7 and 1,6)-dicyanoperylene-3,4:9,10-bis(dicarboximide) (PDIF-CN2),27 and rubrene34 are suspended above a gate electrode. At low temperatures, the mobility (μ) decreases as temperature (T) is lowered due to disorder-induced trapping of charge carriers (not shown for rubrene).

Figure 3

Figure 4. Influence of the gate dielectric on charge-carrier mobility (μ) and its temperature dependence (T), as measured on rubrene single crystals with different gate insulators.33,34 (a) At room temperature, the carrier mobility decreases with increasing dielectric constant (ε), while a crossover from band-like transport to thermally activated hopping is observed in the temperature dependence, as shown in (b) by the decrease of the mobility with decreasing temperature in transistors with higher gate dielectric constants. Note: PDMS, polymethylsiloxane. (c) Schematic view of how holes accumulated in the transistor channel—at the organic/dielectric interface—polarize the gate dielectric.34