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Evaluation of Sitodiplosis mosellana (Diptera: Cecidomyiidae) infestation and relationship with agronomic traits in selected spring wheat cultivars in northwestern Montana, United States of America

Published online by Cambridge University Press:  20 August 2018

Erik R. Echegaray
Affiliation:
Department of Research Centers, Northwestern Agricultural Research Center, Montana State University, 4570 Montana Highway 35, Kalispell, Montana, 59901, United States of America
Christopher R. Barbour
Affiliation:
Department of Research Centers, Northwestern Agricultural Research Center, Montana State University, 4570 Montana Highway 35, Kalispell, Montana, 59901, United States of America
Luther Talbert
Affiliation:
Department of Research Centers, Northwestern Agricultural Research Center, Montana State University, 4570 Montana Highway 35, Kalispell, Montana, 59901, United States of America
Robert N. Stougaard*
Affiliation:
Northwestern Agricultural Research Center, Montana State University, 4570 MT Hwy 35, Kalispell, Montana, 59901, United States of America
*
1Corresponding author (e-mail: rns@montana.edu)

Abstract

The wheat midge, Sitodiplosis mosellana Géhin (Diptera: Cecidomyiidae), is a serious pest of spring wheat in North America. Currently, most commercial cultivars in the state of Montana, United States of America are susceptible. A study was conducted to assess the variability of adapted spring wheat cultivars to wheat midge infestations. A secondary objective was to determine the relationship between wheat midge infestation levels and spring wheat agronomic traits, including yield, test weight, grain protein, plant height, and heading date. This relationship was determined by evaluating 16 hard red spring wheat cultivars over a six-year period at the Northwestern Agricultural Research Center, near Kalispell, Montana. Levels of infestation had a negative impact on grain yield and test weight. Overall, the average infestation level was 40 larvae/spike with the lowest being observed with “Reeder” and the highest for “Thatcher”. Concurrently, “Reeder” had the highest yield, whereas “Thatcher” had the lowest yield and the highest grain protein, demonstrating that wheat midge infestations were positively associated with grain protein. Heading date had a positive association with midge density with higher infestations associated with later maturing cultivars. The economic injury level was estimated at 12 and 20 midge larvae/spike for a market price of USD $0.27 and USD $0.16/kg, respectively.

Information

Type
Insect Management
Copyright
© Entomological Society of Canada 2018 
Figure 0

Table 1 Least-squares means and compact letter display (using an α=0.05 Tukey–Kramer adjustment on all pairwise differences) for differences in wheat midge larvae (square-root) and agronomic traits across 16 spring wheat cultivars for six years combined, from 2006 to 2011.

Figure 1

Fig. 1 Boxplots of wheat midge larvae per spike per plot across years of the study (2006–2011).

Figure 2

Table 2 Analysis of variance F-statistics for cultivar effects (after accounting for year-to-year variation) on midge-larvae (square root), yield, test weight, grain protein, plant height, and heading date.

Figure 3

Fig. 2 Relationship between wheat midge larvae per spike (square root) and A, yield; B, test weight; C, grain protein; D, plant height; and E, heading date. The depicted lines represent the estimated regression lines between each pair of variables assuming a random effect for observations within the same year. In each plot, the estimated year effects have been subtracted from the observations on the y-axis, allowing for a visual representation of the relationship between the agronomic parameters after accounting for the year. The conditional R2 metric ($R_{c}^{2} $) is displayed as a goodness-of-fit measure.

Figure 4

Table 3 F-statistics and P-values for regression coefficients examining associations between wheat midge (square-root) and yield, test weight, grain protein, plant height, and heading date.

Figure 5

Fig. 3 Relationship between per cent seed damage and yield. The depicted line represents the estimated regression line assuming a random effect for observations within the same year. The estimated year effect has been subtracted from the yield values, allowing for a visual representation of the relationship between the per cent seed damage and yield after accounting for the year. The conditional R2 metric ($R_{c}^{2} $) is displayed as a goodness-of-fit measure.