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Pushing the detection limit of thin film magnetoelectric heterostructures

Published online by Cambridge University Press:  22 February 2017

Volker Röbisch
Affiliation:
Institute for Materials Science, Kiel University, Kiel 24143, Germany
Sebastian Salzer
Affiliation:
Institute of Electrical and Information Engineering, Kiel University, Kiel 24143, Germany
Necdet O. Urs
Affiliation:
Institute for Materials Science, Kiel University, Kiel 24143, Germany
Jens Reermann
Affiliation:
Institute of Electrical and Information Engineering, Kiel University, Kiel 24143, Germany
Erdem Yarar
Affiliation:
Institute for Materials Science, Kiel University, Kiel 24143, Germany
André Piorra
Affiliation:
Institute for Materials Science, Kiel University, Kiel 24143, Germany
Christine Kirchhof
Affiliation:
Institute for Materials Science, Kiel University, Kiel 24143, Germany
Enno Lage
Affiliation:
Institute for Materials Science, Kiel University, Kiel 24143, Germany
Michael Höft
Affiliation:
Institute of Electrical and Information Engineering, Kiel University, Kiel 24143, Germany
Gerhard U. Schmidt
Affiliation:
Institute of Electrical and Information Engineering, Kiel University, Kiel 24143, Germany
Reinhard Knöchel
Affiliation:
Institute of Electrical and Information Engineering, Kiel University, Kiel 24143, Germany
Jeffrey McCord
Affiliation:
Institute for Materials Science, Kiel University, Kiel 24143, Germany
Eckhard Quandt
Affiliation:
Institute for Materials Science, Kiel University, Kiel 24143, Germany
Dirk Meyners*
Affiliation:
Institute for Materials Science, Kiel University, Kiel 24143, Germany
*
a) Address all correspondence to this author. e-mail: dm@tf.uni-kiel.de

Abstract

Composite magnetoelectrics implemented as thin film heterostructures are discussed in view of their applicability as highly sensitive magnetic field sensors. Here, either PZT or AlN served as piezoelectric component. The magnetostrictive phase consisted of layer systems based on FeCo or (Fe90Co10)78Si12B10. All functional layers were deposited with thicknesses of a few micrometers on Si cantilever structures with typical lateral dimensions of 25 mm by 2.2 mm. Magnetoelectric coefficients as large as 6900 V/cm Oe and a limit of detection as low as 1 pT/(Hz)1/2 were measured. Currently, the best result demonstrates a detection limit of 500 fT/(Hz)1/2 at 958 Hz frequency using a set of two sensors for external noise suppression. A frequency conversion technique is proposed to broaden the applicability of resonant magnetoelectric sensors to a wider frequency range. Finally, the achieved sensor performance is evaluated with regard to typical magnetic field amplitudes in medical applications.

Information

Type
Invited Feature Paper
Copyright
Copyright © Materials Research Society 2017 
Figure 0

FIG. 1. Noise voltage density of a ME cantilever sensor readout by a charge amplifier. The dashed line indicates three frequency ranges with different dominating noise sources (In: current noise sources of the operational amplifier, EME: Johnson-Nyquist noise of the piezoelectric phase, En: voltage noise of the operational amplifier). Adapted from Ref. 11.

Figure 1

TABLE I. Dielectric, piezoelectric properties and material dependent factors with impact on SNR for AlN and PZT thin films.

Figure 2

FIG. 2. ME properties of a cantilever sensor based on a single FeCoSiB layer and AlN as piezoelectric phase. (a) ME voltage versus fAC for HAC = 1 mOe. An optimum static field HBias = 2.4 Oe was applied for maximum ME response. (b) Absolute value of the ME coefficient versus HBias for HAC = 1 mOe and fAC tuned to fres = 876 Hz. (c) ME voltage versus HAC at the optimum working point (HBias = 2.4 Oe and fAC = 876 Hz). Solid lines indicate linear fits of VME and the noise level. Their intersection determines the limit of detection (arrow). (b) and (c) are adapted from Ref. 20.

Figure 3

FIG. 3. (a) Tuning fork-like assembly of two ME cantilever sensors. The inset shows details of the layer stack configuration. (b) ME voltage versus HAC using the in phase signals of both ME cantilevers with and without application of wideband noise. (c) displays the corresponding measurements of a single cantilever sensor. Adapted from Ref. 14.

Figure 4

FIG. 4. Magnetostriction λ as a function of an externally applied magnetic field HBias. The values for λ were calculated from the measured magnetoelastic coupling coefficient according to λ = −b(1 + νf)(1/Ef).30 Here, νf = 0.3 and Ef = 230 GPa denote the effective Poisson ratio and Young modulus of the FeCo layer system. Every 70th data point is represented by a symbol. The inset specifies the sample set-up including the definition of angle φ. Adapted from Ref. 5.

Figure 5

TABLE II. Limit of detection for thin film magnetoelectric cantilever sensors operated in mechanical resonance.

Figure 6

TABLE III. Limit of detection at selected signal frequencies for thin film magnetoelectric cantilever sensors.

Figure 7

FIG. 5. Amplitude and frequency range of MCG, MEG, and DBS signals in time domain.39–41 Detection limits of magnetoelectric cantilever sensors based on single magnetostrictive layers (exchange biased magnetostrictive multilayers) are represented by black circles (red asterisks). The LOD of the tuning fork-like assembly is indicated by a blue triangle. The direct measurement of the 10 Hz signals was conducted using an integration time equal to 3 s.

Figure 8

FIG. 6. (a) Photograph of a pneumatic scanner with head phantom and inserted DBS electrode. The ME sensor is surrounded by a copper coil to supply a static bias field. During scanner operation the sensor is moved around the phantom on a cylindrical surface. The phantom is a glass head filled with saline solution. The solution’s conductivity matches that of a human brain. (b) Plot of the magnetic flux distribution (radial component) surrounding the head phantom, recorded by the ME sensor while operating the DBS electrode.

Supplementary material: File

Röbisch supplementary material

Table S1

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