Hostname: page-component-74656f9884-2dmjx Total loading time: 0 Render date: 2026-11-08T06:58:54.549Z Has data issue: false hasContentIssue false

Phonon engineering in graphene and van der Waals materials

Published online by Cambridge University Press:  10 September 2014

Alexander A. Balandin*
Affiliation:
University of California–Riverside, USA; balandin@ee.ucr.edu

Abstract

Phonons—quanta of crystal lattice vibrations—reveal themselves in electrical, thermal, optical, and mechanical phenomena in materials. Phonons carry heat, scatter electrons, and affect light–matter interactions. Nanostructures opened opportunities for tuning the phonon spectrum and related properties of materials for specific applications, thus realizing what was termed phonon engineering. Recent progress in graphene and two-dimensional van der Waals materials has led to a better understanding of phonon physics and created additional opportunities for controlling phonon interactions and phonon transport at room temperature. This article reviews the basics of phonon confinement effects in nanostructures, describes phonon thermal transport in graphene, discusses phonon properties of van der Waals materials, and outlines practical applications of low-dimensional materials that rely on phonon properties.

Information

Type
Research Article
Copyright
Copyright © Materials Research Society 2014 
Figure 0

Figure 1. Illustration of phonon confinement effects. (a) Phonon energy dispersion in bulk silicon (red curves) and germanium (blue curves) crystals along the (110)-crystallographic direction, calculated using the five-parameter Born-von Karman model. Acoustic phonon branches are shown with the solid lines, while optical phonon branches are shown with dashed lines. (b) Dispersion of confined phonons in silicon nanowires coated with germanium. The cross-sections of the nanowire core and outside shell are 3.26 nm × 3.26 nm and 4.88 nm × 4.88 nm, respectively. Note that by changing the lateral dimensions of the nanowire and barrier shell, the shape of the cross-section, and the acoustic impedance mismatch at the interface, one can tune the phonon dispersion and group velocity.

Figure 1

Figure 2. Optothermal technique for measuring thermal conductivity of graphene and thin films. (a) Schematic of the experimental setup for optothermal measurements where the excitation laser light is focused on graphene suspended across a trench in a silicon wafer. The laser power absorbed in graphene induces a local hot spot and generates a heat wave propagating toward the graphite or metal heatsinks. (b) Scanning electron microscope image of a graphene flake suspended over a trench. Pseudo-colors are used for clarity: Violet corresponds to graphene, yellow to silicon oxide, and black to the silicon substrate.35

Figure 2

Figure 3. Raman spectroscopy as a nano-metrology tool for atomically thin films of van der Waals materials. (a) Crystal structure of an individual quintuple of Bi2Te3. Bismuth atoms are shown in green color, while telluride atoms are indicated in red and blue. The bonding to the next quintuple is via the outside (blue) telluride atoms. (b) “Graphene-like” exfoliated few-quintuple layer of Bi2Te3 on a silicon substrate. (c) Evolution of the Raman spectrum of a Bi2Te3 thin film as its thickness decreases to the few-quintuple scale. (d) A Bi2Te3 thin-film ribbon suspended across a trench in a silicon wafer.56,60–62

Figure 3

Figure 4. Phonons in thin films of van der Waals materials. (a) Raman spectra of the exfoliated thin films of TaSe2 on a Si substrate. Data are shown for film thicknesses ranging from ∼260 nm to below 30 nm. The characteristic E2g and A1g peaks of TaSe2 are clearly observed. The intensity of the Si peak at 522 cm–1 increases with decreasing thickness of the TaSe2 film. (b) The ratio of the intensity of the Si peak to that of the E2g peak in the Raman spectrum of TaSe2. The calibrated intensity ratio is used for nano-metrology of TaSe2 films. The insets show optical microscopy images of two flakes of TaSe2 with substantially different thicknesses. The thinner flakes appear blue in color, whereas the thicker flakes appear yellowish.68

Figure 4

Figure 5. Charge-density wave effects in thin films of transition-metal dichalcogenides. (a) Temperature dependence of the TiSe2 Raman spectrum of a thinner film (thickness, H = 100 nm) in the cooling cycle from 300 K to 135 K. Note the appearance of well-resolved peaks at ∼207 cm–1 and ∼316 cm–1 after the temperature decreases below the transition temperature TC for a given film thickness. The evolution of the Raman spectrum can be used to investigate the dependence of the transition temperature on the thickness of the films. (b) Dependence of the transition temperature to the charge-density wave regime on the TiSe2 film thickness.67

Figure 5

Figure 6. (a) Phonon energy dispersions in AA-stacked bilayer graphene (AA-BLG) and in (b) twisted bilayer graphene (T-BLG) with θ = 21.8°. All dispersion relations are shown for the Γ–K direction in the Brillouin zone of BLG and T-BLG. The dispersion was calculated using the Born-von-Karman model for the intralayer atomic interactions and the Lennard-Jones potential for the interlayer interactions. The changes in the phonon dispersion affect the specific heat and thermal conductivity.78