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Dispersive double bent crystal monochromators Si(111) + Si(311) and Si(111) + Si(400) with a strongly asymmetric diffraction geometry of the analyzer for powder diffractometry

Published online by Cambridge University Press:  19 March 2019

P. Mikula*
Affiliation:
Neutron Physics Department, Nuclear Physics Institute, ASCR v.v.i, Rez, Czech Republic
M. Vrana
Affiliation:
Neutron Physics Department, Nuclear Physics Institute, ASCR v.v.i, Rez, Czech Republic
J. Saroun
Affiliation:
Neutron Physics Department, Nuclear Physics Institute, ASCR v.v.i, Rez, Czech Republic
J. Stammers
Affiliation:
Neutron Physics Department, Nuclear Physics Institute, ASCR v.v.i, Rez, Czech Republic
V. Em
Affiliation:
National Research Centre “Kurchatov Institute”, Moscow, Russian Federation
*
a)Author to whom correspondence should be addressed. Electronic mail: mikula@ujf.cas.cz

Abstract

In this paper, some results of neutron diffraction properties of the dispersive double-crystal Si(111) + Si(311) and Si(111) + Si(400) monochromator settings containing two bent perfect crystals but with the second one – analyzer in the strongly asymmetric diffraction geometry, are presented. For the sake of possible applications, both double crystal settings were tested in the orientation of the second crystal for the output beam compression geometry. Powder diffraction test was carried out on a α-Fe(211) pin of the diameter of 2 mm. Contrary to the Si(111) + Si(400) setting, an excellent resolution represented by full width at half maximum in the (Δd/d)-scale was obtained for the Si(111) + Si(311) double crystal monochromator in the parallel as well as in the antiparallel diffraction geometry.

Information

Type
Technical Articles
Copyright
Copyright © International Centre for Diffraction Data 2019 
Figure 0

Figure 1. (Color online) The DBC setting with the symmetric diffraction geometry of the first crystal and (a) the FAD-geometry of the second Si(311) crystal or (b) the asymmetric geometry of the second Si(400) crystal. Both cases used OBC orientation.

Figure 1

Figure 2. (Color online) Double-crystal rocking curves of the FAD crystal for different radii of curvature R and different widths of the beam incident on the second crystal: (a) 10 mm, (b) 20 mm, (c) 35 mm.

Figure 2

Figure 3. (Color online) Properties of the output beam profiles from the FAD crystal as a function of the crystal slab curvature imaged by scintillation camera for different widths of the beam incident on the second crystal: (a) 10 mm, (b) 20 mm, (c) 35 mm.

Figure 3

Figure 4. Examples of the diffraction profiles from the α-Fe(211) polycrystalline pin in the parallel and antiparallel diffraction geometry for two widths of the incident beam slit as taken by the Imaging plate.

Figure 4

Figure 5. (Color online) The summarized results of FWHM for different curvatures of the FAD crystal slab and for the incident beam-slit width of 35 mm (a), and the result of the Monte Carlo simulation for the parallel diffraction geometry (b).

Figure 5

Figure 6. (Color online) Profiles of the output beam from the Si(400) crystal as imaged by scintillation camera at the distance of 50 cm for different radii of curvature R at the peak position of the rocking curve and the slit width of 35 mm.

Figure 6

Figure 7. (Color online) Summarized properties of the output beam profiles from Figure 6 as a function of the crystal curvature.

Figure 7

Figure 8. Examples of the diffraction profiles from the α-Fe(211) polycrystalline pin as taken by Imaging plate at 50 cm for different curvatures of the Si(400) slab, 35 mm slit and parallel diffraction geometry.

Figure 8

Figure 9. Complementary examples to the previous ones from Figure 8 of the diffraction profiles from the α-Fe(211) polycrystalline pin for different curvatures of the Si(400) slab, 35 mm slit and antiparallel diffraction geometry.

Figure 9

Figure 10. Summarized FWHMs of the beam profiles from the polycrystalline pin for both diffraction geometries as a function of the curvature of the second bent perfect crystal (BPC) slab.