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Connector-less test setup for measurement of passive inter-modulation products at UHF band

Published online by Cambridge University Press:  28 August 2013

Santhosh Kumar Ramagiri*
Affiliation:
Space Applications Centre, ISRO, Ahmedabad, India
Arvind B. Shukla
Affiliation:
Space Applications Centre, ISRO, Ahmedabad, India
Ramaniklal B. Bavaria
Affiliation:
Space Applications Centre, ISRO, Ahmedabad, India
Surinder Singh
Affiliation:
Space Applications Centre, ISRO, Ahmedabad, India
Kaushik S. Parikh
Affiliation:
Space Applications Centre, ISRO, Ahmedabad, India
*
Corresponding author: S.K. Ramagiri Email: santhoshr@sac.isro.gov.in
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Abstract

This paper describes the establishment of a test setup for measurement of passive inter-modulation (PIM) products generated by various device(s) under test (DUT(s)) (filters, coaxial cables etc.) at ultra high frequency (UHF) band. The paper begins with a brief discussion of an ideal PIM test setup using a quiet load. It then discusses the establishment of the setup in the absence of quiet load and demonstrates a PIM level of −192 dBc of the test setup. Finally it shows the PIM performance of a band-stop filter, a flexible cable, cascade of band-stop filter, and flexible cable, measured using the established test setup. These components are required for UHF payload of a communication satellite.

Information

Type
Research Papers
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2013 
Figure 0

Fig. 1. Block diagram of an ideal test setup for PIM measurement.

Figure 1

Fig. 2. Block diagram of proposed test setup for PIM measurement.

Figure 2

Fig. 3. (a) Photograph of Tx/Tx diplexer. (b) Photograph of Tx/Rx diplexer. (c) Photograph of PIM reject filter and junction box assembly. (d) Photograph of carrier reject filter.

Figure 3

Fig. 4. (a) Measured results of Tx/Tx diplexer. (b) Measured results of Tx/Rx diplexer. (c) Measured results of PIM reject filter–junction box assembly. (d) Measured results of carrier reject filter.

Figure 4

Fig. 5. Photograph of the PIM test setup – through configuration.

Figure 5

Fig. 6. Measured PIM level of the setup.

Figure 6

Fig. 7. Photograph of the PIM test setup with DUT1.

Figure 7

Fig. 8. (a) PIM level of DUT1 measured at ambient temperature. (b) PIM level of DUT1 measured at 85°C.

Figure 8

Fig. 9. Measured PIM level of DUT4.

Figure 9

Fig. 10. Photograph of the PIM test setup with DUT5.

Figure 10

Fig. 11. (a) PIM level of DUT5 measured with input carrier frequencies 254.15 and 243.955 MHz. (b) PIM level of DUT5 measured with input carrier frequencies 254.15 and 243.935 MHz. (c) PIM level of DUT5 measured with input carrier frequencies 254.15 and 243.915 MHz.

Figure 11

Fig. 12. PIM level of DUT5 measured with input carrier frequencies 254.15 and 245 MHz

Figure 12

Table 1. Measured PIM levels of all the devices under test.