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Enhanced upper confidence limits via randomized tests in random sampling without replacement

Published online by Cambridge University Press:  09 October 2025

Zihao Li*
Affiliation:
Fudan University
Huangjun Zhu*
Affiliation:
Fudan University
Masahito Hayashi*
Affiliation:
The Chinese University of Hong Kong
*
*Postal address: Department of Physics and State Key Laboratory of Surface Physics, Institute for Nanoelectronic Devices and Quantum Computing, Center for Field Theory and Particle Physics, Fudan University, Shanghai 200433, China.
*Postal address: Department of Physics and State Key Laboratory of Surface Physics, Institute for Nanoelectronic Devices and Quantum Computing, Center for Field Theory and Particle Physics, Fudan University, Shanghai 200433, China.
****Postal address: School of Data Science, The Chinese University of Hong Kong, Shenzhen, Longgang District, Shenzhen 518172, China; International Quantum Academy (SIQA), Futian District, Shenzhen 518048, China; and Graduate School of Mathematics, Nagoya University, Chikusa-ku, Nagoya 464-8602, Japan. Email: hmasahito@cuhk.edu.cn
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Abstract

In this paper we study one-sided hypothesis testing under random sampling without replacement, which frequently appears in the cryptographic problem setting, including the verification of measurement-based quantum computation. Suppose that $n+1$ binary random variables $X_1,\ldots, X_{n+1}$ follow a permutation invariant distribution and n binary random variables $X_1,\ldots, X_{n}$ are observed. Then, we propose randomized tests with a randomization parameter for the expectation of the $(n+1)$th random variable $X_{n+1}$ under a given significance level $\delta>0$. Our randomized tests significantly improve the upper confidence limit over deterministic tests. Our problem setting commonly appears in machine learning in addition to cryptographic scenarios by considering adversarial examples. Such studies are essential for expanding the applicable area of statistics. Although this paper addresses only binary random variables, a similar significant improvement by randomized tests can be expected for general non-binary random variables.

Information

Type
Original Article
Copyright
© The Author(s), 2025. Published by Cambridge University Press on behalf of Applied Probability Trust
Figure 0

Figure 1. Figure 1 long description.Positional relation among the points (a0,b0),(a1,b1),…,(ak,bk),(ak+1,bk+1)$(a_0,b_0),(a_1,b_1),\ldots, (a_{k},b_{k}),(a_{k+1},b_{k+1})$. Due to (22), the point (ak,bk)$(a_{k},b_{k})$ is located above the line segment between the points (ak−1,bk−1)$(a_{k-1},b_{k-1})$ and (ak+1,bk+1)$(a_{k+1},b_{k+1})$. This positional relation shows that the maximum in (23) is achieved by a probabilistic mixture among the three points (ak−1,bk−1),(ak,bk),(ak+1,bk+1)$(a_{k-1},b_{k-1}),(a_{k},b_{k}),(a_{k+1},b_{k+1})$.

Figure 1

Figure 2. Figure 2 long description.(a) Variations of upper confidence limits in the constant regime. Here k0=100$k_0=100$ and δ=0.1$\delta=0.1$. The symbols ‘×$\times$’ represent ϵ¯i.i.d.(Tk0,n,δ)$\overline{\epsilon}_{\textrm{i.i.d.}}(T_{k_0},n,\delta)$, ‘∗$*$’ represent ϵ¯(Tk0(0),n,δ)$\overline{\epsilon}(T_{k_0}(0),n,\delta)$, whereas other symbols represent ϵ¯(T⌈νk0⌉(λ),n,δ)$\overline{\epsilon}(T_{\lceil\nu k_0\rceil}(\lambda) ,n,\delta)$. The five curves from left to right represent the approximate formula in (66), (63), (63), (63), and (62), respectively (the terms O(n−1)$O(n^{-1})$ are ignored). (b) Variations of upper confidence limits in the linear regime. Here s=0.1$s=0.1$ and δ=0.1$\delta=0.1$. The symbols ‘×$\times$’ represent ϵ¯i.i.d.(T⌈sn⌉,n,δ)$\overline{\epsilon}_{\textrm{i.i.d.}}(T_{\lceil s n\rceil},n,\delta)$, and other symbols represent ϵ¯(T⌈sνn⌉(λ),n,δ)$\overline{\epsilon}(T_{\lceil s\nu n\rceil}(\lambda),n,\delta)$. The four curves from left to right represent the approximate formula in (37), (35), (30), and (30), respectively (the terms O(n−1)$O(n^{-1})$ are ignored); ϵ¯(T⌈sn⌉(0),n,δ)$\overline{\epsilon}(T_{\lceil s n\rceil}(0),n,\delta)$ is not shown because its value is too large.

Figure 2

Figure 3. Figure 3 long description.(a) Variations of argmaxλ∈(0,1)⁡κ(λ)$\mathop{\textrm{argmax}}_{\lambda \in (0, 1)}\kappa(\lambda)$ with e−t$e-t$ for different θ0$\theta_0$. Here we choose δ=0.1$\delta=0.1$. The curves are calculated by solving (58) based on Lemma 2. (b) Variations of the power with e−t$e-t$. Here θ0=0.1$\theta_0=0.1$ and δ=0.1$\delta=0.1$. The first curve from the left expresses (59), which corresponds to the i.i.d. case; the other three curves express (57). The power Φ$\Phi$(56) is not shown because its value is too small.

Figure 3

Figure 4. Figure 4 long description.The region Rl,n,λ${\mathcal R}_{l,n,\lambda}$ composed of points (pl(Q),fl(Q))$(p_l (Q),f_l (Q))$ as defined in (74). The region is the convex hull of the points in (78), which are highlighted as dots. Here we choose l=3$l=3$ for all plots.

Figure 4

Figure K.1 Figure K.1 long description.(a) The lower boundary of Rl,n,λ${\mathcal R}_{l,n,\lambda}$ is not higher than that of Rl,n+1,λ${\mathcal R}_{l,n+1,\lambda}$ for n≥l+1$n\geq l+1$. The lower (upper) solid lines and circular (triangular) symbols represent the lower boundary and extremal points of Rl=1,n=5,λ=1/e${\mathcal R}_{l=1,n=5,\lambda=1/\mathrm{e}}$ (Rl=1,n=6,λ=1/e${\mathcal R}_{l=1,n=6,\lambda=1/\mathrm{e}}$), respectively. (b) The lower boundary of Rl+1,n,λ${\mathcal R}_{l+1,n,\lambda}$ is not higher than that of Rl,n,λ${\mathcal R}_{l,n,\lambda}$ for n≥l+2$n\geq l+2$. The upper (lower) solid lines and circular (triangular) symbols represent the lower boundary and extremal points of Rl=1,n=5,λ=1/e${\mathcal R}_{l=1,n=5,\lambda=1/\mathrm{e}}$ (Rl=2,n=5,λ=1/e${\mathcal R}_{l=2,n=5,\lambda=1/\mathrm{e}}$), respectively.