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A chemomechanical coupling model for oxidation and stress evolution in ZrB2–SiC

Published online by Cambridge University Press:  05 January 2017

Hailong Wang
Affiliation:
State Key Laboratory for Strength and Vibration of Mechanical Structures, School of Aerospace, Xi’an Jiaotong University, Xi’an 710049, China
Shengping Shen*
Affiliation:
State Key Laboratory for Strength and Vibration of Mechanical Structures, School of Aerospace, Xi’an Jiaotong University, Xi’an 710049, China
*
a) Address all correspondence to this author. e-mail: sshen@mail.xjtu.edu.cn

Abstract

A chemomechanical coupling model is presented in the temperature range of 1200–1800 °C based on the microstructure during oxidation of ZrB2–SiC. The model includes the interaction of the oxidation rate and the mechanical stress. The stress is generated due to the constraint from the substrate to the lateral growth. The generated stress results in the shrink of the pores in the oxide. At the outer glassy layer surface, the boundary layer evaporation is adopted to describe the evaporation rate. Using the coupling model, the evolutions of the oxide layer thickness, weight gain, pore radius, and stress in both the oxide and substrate are provided, and the theoretical calculated results agree well with the reported experimental results. The results reveal large stress in the oxide layer during the oxidation process. By comparing the results of ZrB2 with different volume fractions of SiC, it is found that ZrB2 with higher volume fraction of SiC has more excellent oxidation resistance and smaller stress.

Information

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Articles
Copyright
Copyright © Materials Research Society 2017 
Figure 0

FIG. 1. Oxidation schematic of ZrB2–SiC.

Figure 1

TABLE I. Material properties used in the calculation.

Figure 2

FIG. 2. Calculated oxide layer thickness compared with experimental data2,60 for ZrB2–20 vol% SiC oxidized at 1873 K [from Eqs. (5), (6), and (9)].

Figure 3

FIG. 3. Calculated weight gain compared with experimental data2,60 for ZrB2–20 vol% SiC oxidized at 1873 K [from Eq. (10)].

Figure 4

FIG. 4. Stress evolution in the oxide layer for ZrB2–20 vol% SiC oxidized at 1873 K [from Eq. (11)].

Figure 5

FIG. 5. Stress evolution in the substrate for ZrB2–20 vol% SiC oxidized at 1873 K [from Eq. (12)].

Figure 6

FIG. 6. Pore radius evolution for ZrB2–20 vol% SiC oxidized at 1873 K [from Eq. (14)].

Figure 7

FIG. 7. fg evolution for ZrB2–20 vol% SiC oxidized at 1873 K [from Eq. (15)].

Figure 8

FIG. 8. Oxide layer thickness for ZrB2 with different SiC content oxidized at 1873 K [from Eqs. (5), (6) and (9)].

Figure 9

FIG. 9. Weight gain for ZrB2 with different SiC contents oxidized at 1873 K [from Eq. (10)].

Figure 10

FIG. 10. Stress evolution in the oxide layer for ZrB2 with different SiC content oxidized at 1873 K [from Eq. (11)].

Figure 11

FIG. 11. Stress evolution in the substrate for ZrB2 with different SiC content oxidized at 1873 K [from Eq. (12)].